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參數(shù)資料
| 型號： | TC55RP6001EZB |
| 廠商： | TelCom Semiconductor, Inc. |
| 元件分類： | 基準(zhǔn)電壓源/電流源 |
| 英文描述： | 5.0 AMP POSITIVE VOLTAGE REGULATOR |
| 中文描述： | 5.0放大器正電壓穩(wěn)壓器 |
| 文件頁數(shù)： | 3/3頁 |
| 文件大?。?/td> | 49K |
| 代理商： | TC55RP6001EZB |
4-129
TELCOM SEMICONDUCTOR, INC.
7
6
5
4
3
1
2
8
TC55 Series
LOW DROPOUT
POSITIVE VOLTAGE REGULATOR
TC55RP30 ELECTRICAL CHARACTERISTICS:
V
OUT
(S) = 5.0V, T
A
= 25
°
C unless otherwise specified (see REMARKS).
Symbol
Parameter
Test Conditions
Min
Typ
Max
Unit
V
OUT
(A)
Output Voltage
I
OUT
= 40mA
V
IN
= 4.0V
V
IN
= 4.0V, V
OUT
(A)
≥
2.7V
V
IN
= 4.0V, 1 mA
≤
I
OUT
≤
80mA
I
OUT
= 80mA
I
OUT
= 160mA
V
IN
= 4.0V
I
OUT
= 40mA
4.0V
≤
V
IN
≤
10.0V
—
2.94
150
—
—
—
—
—
—
3.0
—
45
180
400
0.9
0.2
—
3.06
—
90
360
700
2.8
0.3
V
I
OUT
max
V
OUT
V
dif
Maximum Output Current
Load Regulation
I/O Voltage Difference
mA
mV
mV
I
SS
V
OUT
(A)·100
V
IN
·V
OUT
(S)
V
IN
V
OUT
(A)·10
6
T
A
·V
OUT
(S)
Current Consumption
Voltage Regulation
μ
A
%/V
Input Voltage
Temperature Coefficient
of Output Voltage
Long Term Stability
—
—
—
10.0
—
V
I
OUT
= 40mA
– 40
°
C
≤
T
A
≤
85
°
C
T
A
= 125
°
C, 1000 Hours
±
100
ppm/
°
C
—
0.5
—
%
MARKING
SOT-23A-3
SOT-89-3
x
x
TO-92-3
8
12
4
7
11
3
6
10
2
5
9
1
a
represents first voltage digit
2
3
4
ex: 3.xV =
uuuu
5
6
b
represents first decimal place voltage (x.0 - x.9)
A = x.0
E = x.4
B = x.1
F = x.5
C = x.2
H = x.6
D = x.3
K = x.7
ex: 3.4V =
uuuu
L = x.8
M = x.9
c
represents Polarity
0 = Positive (fixed)
d
represents assembly lot number
3
3
E
a
,
b
,
c
&
d
= 55RP (fixed)
e
= first voltage digit (2-6)
f
= first voltage decimal (0-9)
g
= extra feature code : fixed : 0
h
= regulation accuracy
1 =
±
1.0% (custom), 2 =
±
2.0% (standard)
i
,
j
,
k
&
l
= assembly lot number
*Static-sensitive device. Unused devices must be stored in conductive material. Protect devices from static discharge and static fields. Stresses above those
listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only and functional operation of the device
at these or any other conditions above those indicated in the operational sections of the specifications is not implied. Exposure to Absolute Maximum Rating
Conditions for extended periods may affect device reliability.
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