參數(shù)資料
型號: SY58620LMG TR
廠商: Micrel Inc
文件頁數(shù): 5/18頁
文件大?。?/td> 0K
描述: TXRX 4.25GBPS CML OUT 24-MLF
標(biāo)準(zhǔn)包裝: 1,000
類型: 收發(fā)器
驅(qū)動器/接收器數(shù): 1/1
電源電壓: 3 V ~ 3.6 V
安裝類型: 表面貼裝
封裝/外殼: 24-VFQFN 裸露焊盤,24-MLF?
供應(yīng)商設(shè)備封裝: 24-MLF?(4x4)
包裝: 帶卷 (TR)
其它名稱: SY58620LMGTR
SY58620LMGTR-ND
Micrel, Inc.
SY58620L
January 2006
13
M9999-012006-C
hbwhelp@micrel.com or (408) 955-1690
PRBS Discussion
LOS Testing
The LOS function is tested with a 2
7-1 PRBS (Pseudo
Random Bit Stream) data pattern. A PRBS data
pattern of 2
7-1 is used because it is a good
approximation
to
an
8b10b-encoded
NRZ
data
stream. 8b10b encodes 8 bits of data and replaces it
with 10 bits of symbol. The extra bits are added to
improve transition density and the BER (Bit Error
Rate) of the system.
Deterministic Jitter Testing and the K28.5 Pattern
The K28.5 (11000001010011111010) and 2
23-1 PRBS
data patterns are used to characterize DJ because
both data patterns have lower spectral frequency
content which provides a best approximation to
scrambled NRZ data streams.
Random Jitter Testing and the K28.7 Pattern
The K28.7 (1111100000…) data pattern is used to
measure RJ since the pattern is free of DJ. In
addition, because the K28.7 data pattern can be used
to compare the TN (N
TH period) to the T
0 (1
st period),
low frequency jitter components can be accumulated.
Power Supply Filtering
Although the SY58620L is fully differential, it is
recommended that the power supplies are filtered as
shown in Figure 4.
Figure 4. Power Supply Filtering Scheme
Item
Description
C1, C2, C3, C23
0.1F Capacitor
C4, C5, C6, C22
0.01F Capacitor
L1, L2, L3
1.2H Ferrite Bead Inductor
Table 1. Bill of Materials
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