
The data containedat this address is then clocked
out serially. The address pointer is automatically
incrementedafterthedataisoutputand,iftheChip
Select input (S) is held High, the ST93C06 can
output a sequentialstream of data bytes/words. In
thisway, the memorycanbe readasa datastream
from 8 to 256 bits long, or continuously as the
address counter automatically rolls over to ’00’
when the highest address is reached. Program-
ming is internally self-timed (the external clock
signal on C input may be disconnected or left
running after the start of a Write cycle) and does
notrequirean erasecycle priorto the Writeinstruc-
tion. The Writeinstruction writes 8or 16 bitsat one
time into one of the 32 bytesor 16 words. After the
startoftheprogrammingcycle aBusy/Readysignal
is available on the Data output (Q) when Chip
Select(S) is driven High.
The design of the ST93C06 and the High Endur-
anceCMOStechnologyusedforitsfabricationgive
an Erase/Write cycle Endurance of 1,000,000 cy-
clesand adata retention of 40 years.
VSS
Q
ORG
DU
C
D
S
VCC
AI00817B
ST93C06
ST93C06C
1
2
3
4
8
7
6
5
Figure2A. DIPPin Connections
1
2
3
4
VSS
Q
ORG
DU
C
D
S
VCC
AI00818C
ST93C06
ST93C06C
8
7
6
5
Figure 2B. SOPin Connections
DESCRIPTION
(cont’d)
Warning:
DU = Don’t Use
Warning:
DU = Don’t Use
Symbol
Parameter
Value
Unit
T
A
Ambient Operating Temperature
–40 to 125
°
C
T
STG
Storage Temperature
–65 to150
°
C
T
LEAD
Lead Temperature,Soldering
(SO8 package)
(PSDIP8 package)
40 sec
10 sec
215
260
°
C
V
IO
Input or Output Voltages(Q = V
OH
or Hi-Z)
–0.3 to V
CC
+0.5
V
V
CC
Supply Voltage
–0.3 to 6.5
V
V
ESD
Electrostatic Discharge Voltage (Human Body model)
(2)
ST93C06
ST93C06C
2000
4000
V
Electrostatic Discharge Voltage (Machine model)
(3)
ST93C06
ST93C06C
500
500
V
Notes:
1. Except for the rating ”O(jiān)perating Temperature Range”, stresses above those listed in the Table ”Absolute MaximumRatings”
may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other
conditions abovethose indicated in the Operating sectionsof this specification is not implied. Exposure to Absolute Maximum
Rating conditions for extended periods may affect device reliability.Refer also to the SGS-THOMSON SURE Program and other
relevant quality documents.
2. MIL-STD-883C, 3015.7 (100pF, 1500
).
3. EIAJ IC-121 (Condition C) (200pF, 0
).
Table 2. Absolute Maximum Ratings
(1)
2/15
ST93C06, ST93C06C