
3
6/26/01
SPT5420
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
LEVEL
TEST PROCEDURE
I
100% production tested at the specified temperature.
100% production tested at T
A
= +25
°
C, and sample tested at the
specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and characteri-
zation data.
Parameter is a typical value for information purposes only.
100% production tested at T
A
= +25
°
C. Parameter is guaranteed
over specified temperature range.
II
III
IV
V
VI
ELECTRICAL SPECIFICATIONS
T
A
= T
MIN
to T
MAX
, V
CC
= +5.0 V, V
DD
= +11.5 V, V
SS
=
–
8.0 V, V
REFT
=3.5 V, V
REFB
=
–
1.5 V, R
L
= +10 k
, C
L
= 50 pF, unless otherwise specified.
TEST
CONDITIONS
TEST
LEVEL
SPT5420
PARAMETERS
MIN
TYP
MAX
UNITS
Power Requirements
V
CC
Supply Voltage (Digital)
V
DD
Supply Voltage (Analog)
1,2
V
SS
Supply Voltage (Analog)
1,2
I
CC
Supply Current
I
DD
Supply Current
I
SS
Supply Current
Power Supply Rejection Ratio
IV
VI
VI
VI
VI
VI
IV
IV
4.75
5
5.25
12.5
–
5
0.5
10
10
V
V
V
mA
mA
mA
dB
dB
5
11.5
–
8
–
12.5
Outputs Unloaded
Outputs Unloaded
V
DD
/
Full Scale
V
SS
/
Full Scale
5
5
80
80
Dynamic Performance
Output Settling Time
3
(Full Scale Change to ±0.5 LSB) C
L
≤
220 pF
Slew Rate
Glitch Impulse
Channel to Channel Isolation
DAC to DAC Crosstalk
Digital Crosstalk
Digital Feedthrough
IV
V
V
V
V
V
V
15
μs
V/μs
nV-s
dB
nV-s
nV-s
nV-s
2.0
35
100
40
1
1
Timing Characteristics
(See page 4)
IV
1. Supplies should provide 2.5 V headroom above and below max output swing.
2. V
DD
–
V
SS
≤
20 V
3. Output can drive 10,000 pF without oscillation, but with settling time degradation.
DEFINITION OF SELECTED TERMINOLOGY
Channel-to-Channel Isolation
Channel-to-Channel isolation refers to the proportion of input signal from one DAC
’
s reference input that appears at the output of
the other DAC. It is expressed in dBs.
DAC-to-DAC Crosstalk
DAC-to-DAC crosstalk is defined as the glitch impulse that appears at one DAC
’
s output due to both the digital change and subse-
quent analog output change at any other DAC. It is specified in nV-s.
Digital Crosstalk
The glitch impulse transferred to one DAC
’
s output due to a change in digital input code of any other DAC. It is specified in nV-s.
Digital Feedthrough
Digital feedthrough is the noise at a DAC
’
s output caused by changes to D0
–
D12 while
WR
is high.