參數(shù)資料
型號(hào): SPT5230
廠商: Fairchild Semiconductor Corporation
英文描述: 10-BIT, 36 MWPS TRIPLE VIDEO DAC
中文描述: 10位,36 MWPS三路視頻DAC
文件頁數(shù): 2/7頁
文件大?。?/td> 51K
代理商: SPT5230
2
5/1/00
SPT5230
Note
: 1. Operation at any Absolute Maximum Rating is not implied. See Electrical Specifications for proper nominal applied
conditions in typical applications.
ABSOLUTE MAXIMUM RATINGS (Beyond which damage may occur)
1
Supply Voltages
AV
DD
(measured to AV
SS
)...........................–0.3 to 7.0 V
Input Voltage
Clock and Data ......................................... AV
SS
to AV
DD
Output Current
I
OUT...........................................................................
0 to 14 mA
Temperature
Operating, ambient ........................................ 0 to +70
°
C
Storage ...................................................–55 to + 125
°
C
ELECTRICAL SPECIFICATIONS
f
CLK
= 27 MWPS, AV
DD
= 5.0 V, Output Pull-Up Load = 75
, T
A
= 25
°
C, AV
SS
= 0.0 V
TEST
CONDITIONS
TEST
LEVEL
PARAMETERS
DC Performance
Resolution
Differential Linearity
Integral Linearity
Analog Outputs
Output Voltage Range
Conversion Rate
Output Offset Voltage
Signal-to-Noise Ratio
Settling Time
1
Propagation Delay (t
pd
)
Crosstalk
FS Control Voltage (V
CS2
)
Digital Inputs and Timing
Input Current, Logic High
MIN
TYP
MAX
UNITS
10.0
Bits
LSB
LSB
T
A
= T
MIN
to T
MAX
I
I
–1.0
–2.5
1.0
2.0
V
CS2
= +2.1 V
I
I
I
I
I
3.0
27
5.0
V
MWPS
mV
dB
ns
ns
dB
V
36
2.4
52
16
10
–54
14
46
23
12
V
I
V
–49
2.0
4.0
V
IH
= 5 V
V
IL
= 0 V
I
I
I
I
5
μ
A
μ
A
ns
ns
%
Logic Low
–5
5
10
40
Set-Up Time, Data and Controls (t
S
)
Hold Time, Data and Controls (t
h
)
Clock Duty Cycle
Power Supply Requirements
Supply Voltage
Supply Current
V
60
I
4.75
5.25
56
100
280
500
V
mA
mA
mW
mW
1 Vp-p Output
2 Vp-p Output
1 Vp-p Output
2 Vp-p Output
IV
I
IV
I
Power Dissipation
485
1
Full-scale settling time to within
±
2% of full scale.
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
=25
°
C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design
and characterization data.
Parameter is a typical value for information purposes
only.
100% production tested at T
A
= 25
°
C. Parameter is
guaranteed over specified temperature range.
TEST LEVEL
I
II
III
IV
V
VI
相關(guān)PDF資料
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