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參數(shù)資料
| 型號： | SN74BCT8240ADWRE4 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS |
| 中文描述： | 掃描測試設(shè)備與八進(jìn)制反向緩沖器 |
| 文件頁數(shù)： | 4/26頁 |
| 文件大?。?/td> | 473K |
| 代理商： | SN74BCT8240ADWRE4 |
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SN54BCT8240A, SN74BCT8240A
SCAN TEST DEVICES
WITH OCTAL INVERTING BUFFERS
SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
NAME
DESCRIPTION
1A1–1A4,
2A1–2A4
Normal-function data inputs. See function table for normal-mode logic. Internal pullups force these inputs to a high level if
left unconnected.
GND
Ground
1OE, 2OE
Normal-function output-enable inputs. See function table for normal-mode logic. Internal pullups force these inputs to a high
level if left unconnected.
TCK
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous to
TCK. Data is captured on the rising edge of TCK and outputs change on the falling edge of TCK. An internal pullup forces
TCK to a high level if left unconnected.
TDI
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data through
the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register. An internal pullup forces TDO to a high level when it is not active
and is not driven from an external source.
TMS
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through its
TAP-controller states. An internal pullup forces TMS to a high level if left unconnected. TMS also provides the optional test
reset signal of IEEE Standard 1149.1-1990. This is implemented by recognizing a third logic level, double high (VIHH), at TMS.
Supply voltage
VCC
1Y1–1Y4,
2Y1–2Y4
Normal-function data outputs. See function table for normal-mode logic.
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| SN54BCT8240AFK | SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS |
| SN54BCT8240AJT | SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS |
| SN74BCT8240ANT | SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS |
| SN74BCT8240ANTE4 | SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS |
| SN74BCT8374ANTE4 | SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN74BCT8240ADWRG4 | 功能描述:特定功能邏輯 IEEE Std 1149.1 Bndry Sacn Tst Devic RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8240ANT | 功能描述:緩沖器和線路驅(qū)動器 Device w/Octal Inverting Buffers RoHS:否 制造商:Micrel 輸入線路數(shù)量:1 輸出線路數(shù)量:2 極性:Non-Inverting 電源電壓-最大:+/- 5.5 V 電源電壓-最小:+/- 2.37 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:MSOP-8 封裝:Reel |
| SN74BCT8240ANTE4 | 功能描述:特定功能邏輯 Device w/Octal Inverting Buffers RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8244ADW | 功能描述:特定功能邏輯 Device w/Octal Buffers RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8244ADWE4 | 功能描述:特定功能邏輯 Device w/Octal Buffers RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
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