參數(shù)資料
型號： SN54LVTH18502AHV
廠商： Texas Instruments, Inc.
英文描述： 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
中文描述： 的3.3V ABT生根粉掃描測試設(shè)備與18位通用總線收發(fā)器
文件頁數(shù)： 30/38頁
文件大小： 613K
代理商： SN54LVTH18502AHV
SCBS668C JULY 1996 REVISED JUNE 2004
30
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
recommended operating conditions (see Note 4)
SN54LVTH182502A
MIN
SN74LVTH182502A
MIN
UNIT
MAX
MAX
VCC
VIH
VIL
VI
Supply voltage
2.7
3.6
2.7
3.6
V
High-level input voltage
2
2
V
Low-level input voltage
0.8
0.8
V
Input voltage
5.5
5.5
V
IOH
High-level output current
A port, TDO
24
32
mA
B port
12
12
IOL
Low-level output current
A port, TDO
24
32
mA
B port
12
12
IOL
t/
v
TA
Current duty cycle
≤
50%, f
≥
1 kHz
NOTE 1: All unused CLK, LE, or TCK inputs of the device must be held at VCC or GND to ensure proper device operation. Refer to the TI
application report,
Implications of Slow or Floating CMOS Inputs
, literature number SCBA004.
Low-level output current
A port, TDO
48
64
mA
Input transition rise or fall rate
Outputs enabled
10
10
ns/V
°
C
Operating free-air temperature
55
125
40
85
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相關(guān)PDF資料
PDF描述
SN54LVTH182502AHV 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN54LVTH543 3.3-V ABT OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS
SN54LVTH543FK Shift Register 3-State; Package: SOIC 16 LEAD; No of Pins: 16; Container: Tape and Reel; Qty per Container: 2500
SN54LVTH543JT Shift Register 3-State; Package: SOIC 16 LEAD; No of Pins: 16; Container: Tape and Reel; Qty per Container: 2500
SN54LVTT244 3.3-V ABT OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
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