- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄365640 > SN54LVTH18502AHV (Texas Instruments, Inc.) 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS PDF資料下載
參數(shù)資料
| 型號： | SN54LVTH18502AHV |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
| 中文描述： | 的3.3V ABT生根粉掃描測試設備與18位通用總線收發(fā)器 |
| 文件頁數(shù)： | 2/38頁 |
| 文件大小： | 613K |
| 代理商： | SN54LVTH18502AHV |
第1頁當前第2頁第3頁第4頁第5頁第6頁第7頁第8頁第9頁第10頁第11頁第12頁第13頁第14頁第15頁第16頁第17頁第18頁第19頁第20頁第21頁第22頁第23頁第24頁第25頁第26頁第27頁第28頁第29頁第30頁第31頁第32頁第33頁第34頁第35頁第36頁第37頁第38頁
SCBS668C JULY 1996 REVISED JUNE 2004
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
Four dedicated test pins are used to observe and control the operation of the test circuitry: test data input (TDI),
test data output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs
other testing functions such as parallel-signature analysis (PSA) on data inputs and pseudorandom pattern
generation (PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
The B-port outputs of ’LVTH182502A, which are designed to source or sink up to 12 mA, include 25-
series
resistors to reduce overshoot and undershoot.
The SN54LVTH18502A and SN54LVTH182502A are characterized for operation over the full military
temperature range of 55
°
C to 125
°
C. The SN74LVTH18502A and SN74LVTH182502A are characterized for
operation from 40
°
C to 85
°
C.
1B4
1B5
1B6
GND
1B7
1B8
1B9
V
CC
NC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
NC
V
CC
2A1
2A2
2A3
GND
2A4
2A5
2A6
V
N
T
1
1
1
1
G
1
1
T
N
T
2
2
2
G
2
2
2
T
2
2
1
1
G
2
2
2
G
1
1
1
SN54LVTH18502A, SN54LVTH182502A . . . HV PACKAGE
(TOP VIEW)
C
V
C
NC No internal connection
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
28 29 30 31 32 33 34
8
7
6
5
4
9
3
1 68 67
2
35 36 37 38 39
66 65
27
64 63 62 61
40 41 42 43
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN54LVTH182502AHV | 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54LVTH543 | 3.3-V ABT OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS |
| SN54LVTH543FK | Shift Register 3-State; Package: SOIC 16 LEAD; No of Pins: 16; Container: Tape and Reel; Qty per Container: 2500 |
| SN54LVTH543JT | Shift Register 3-State; Package: SOIC 16 LEAD; No of Pins: 16; Container: Tape and Reel; Qty per Container: 2500 |
| SN54LVTT244 | 3.3-V ABT OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54S00J | 制造商:Texas Instruments 功能描述:NAND Gate 4-Element 2-IN Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| SN54S00W | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| SN54S02J | 制造商:Texas Instruments 功能描述: |
| SN54S03J | 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:2-INPUT NAND GATE (OC) - Rail/Tube |
| SN54S04J | 制造商:Texas Instruments 功能描述:Inverter 6-Element Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:INVERTER 6-ELEM BIPOLAR 14CDIP - Rail/Tube 制造商:Texas Instruments 功能描述:HEX INVERTER *NIC* |
發(fā)布緊急采購，3分鐘左右您將得到回復。