參數(shù)資料
型號： SN54LVTH182502AHV
廠商： Texas Instruments, Inc.
英文描述： 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
中文描述： 的3.3V ABT生根粉掃描測試設備與18位通用總線收發(fā)器
文件頁數(shù)： 25/38頁
文件大?。?/td> 613K
代理商： SN54LVTH182502AHV
SCBS668C JULY 1996 REVISED JUNE 2004
25
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
E
E
T
1
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25
R
S
S
C
S
U
S
C
S
U
S
S
T
TCK
TMS
TDI
TDO
TAP
Controller
State
3-State (TDO) or Don’t Care (TDI)
Figure 13. Timing Example
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
Input voltage range, V
I
(see Note 1)
Voltage range applied to any output in the high state or power-off state, V
O
(see Note 1)
Current into any output in the low state, I
O
: SN54LVTH18502A
SN54LVTH182502A (A port or TDO)
SN54LVTH182502A (B port)
SN74LVTH18502A
SN74LVTH182502A (A port or TDO)
SN74LVTH182502A (B port)
Current into any output in the high state, I
O
(see Note 2): SN54LVTH18502A
0.5 V to 4.6 V
0.5 V to 7 V
0.5 V to 7 V
. . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
96 mA
96 mA
30 mA
128 mA
128 mA
30 mA
48 mA
48 mA
30 mA
64 mA
64 mA
30 mA
50 mA
50 mA
67
°
C/W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . .
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. . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . .
SN54LVTH182502A (A port or TDO)
SN54LVTH182502A (B port)
SN74LVTH18502A
. . . . . . . . . . . . . . . . . . . .
SN74LVTH182502A (A port or TDO)
SN74LVTH182502A (B port)
. . . .
. . . . . . . . . . .
. . . .
. . . . . . . . . . .
Input clamp current, I
IK
(V
I
< 0)
Output clamp current, I
OK
(V
O
< 0)
Package thermal impedance,
θ
JA
(see Note 3): PM package
Storage temperature range, T
stg
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings can be exceeded if the input and output clamp-current ratings are observed.
2. This current only flows when the output is in the high state and VO > VCC.
3. The package thermal impedance is calculated in accordance with JESD 51.
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
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. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
65
°
C to 150
°
C
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