參數(shù)資料
型號(hào)： SN54LVT18502HV
廠商： Texas Instruments, Inc.
英文描述： 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
中文描述： 的3.3V ABT生根粉掃描測(cè)試設(shè)備與18位通用總線收發(fā)器
文件頁(yè)數(shù)： 1/29頁(yè)
文件大小： 405K
代理商： SN54LVT18502HV
SN54LVT18502
3.3-V ABT SCAN TEST DEVICE
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS669 – JULY 1996
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Member of the Texas Instruments SCOPE
Family of Testability Products
Member of the Texas Instruments
Widebus
Family
State-of-the-Art 3.3-V ABT Design Supports
Mixed-Mode Signal Operation (5-V Input
and Output Voltages With 3.3-V V
CC
)
Supports Unregulated Battery Operation
Down to 2.7 V
UBT
(Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
Bus Hold on Data Inputs Eliminates the
Need for External Pullup Resistors
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
SCOPE
Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions and Optional CLAMP and
HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
Packaged in 68-Pin Ceramic Quad Flat (HV)
Packages Using 25-mil Center-to-Center
Spacings
1B4
1B5
1B6
GND
1B7
1B8
1B9
V
CC
NC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
NC
V
CC
2A1
2A2
2A3
GND
2A4
2A5
2A6
V
N
T
1
1
1
1
G
1
1
T
N
T
2
2
2
G
2
2
2
T
2
2
1
1
G
2
2
2
G
1
1
1
HV PACKAGE
(TOP VIEW)
C
V
C
NC – No internal connection
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
28 29 30 31 32 33 34
8 7
6
5
4
9
3
1 68 67
2
35 36 37 38 39
66 65
27
64 63 62 61
40 41 42 43
Copyright
1996, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, Widebus, and UBT are trademarks of Texas Instruments Incorporated.
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