參數(shù)資料
型號(hào): SN54HCT00
廠商: Texas Instruments, Inc.
英文描述: Quadruple 2-Input Positive-Nand Gates(四2輸入正與非門)
中文描述: 四2輸入正和非門(四2輸入正與非門)
文件頁(yè)數(shù): 1/4頁(yè)
文件大?。?/td> 97K
代理商: SN54HCT00
SN54HCT00, SN74HCT00
QUADRUPLE 2-INPUT POSITIVE-NAND GATES
SCLS062A – NOVEMBER 1988 – REVISED JANUARY 1996
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Inputs Are TTL-Voltage Compatible
Package Options Include Plastic
Small-Outline (D), Thin Shrink
Small-Outline (PW), and Ceramic Flat (W)
Packages, Ceramic Chip Carriers (FK), and
Standard Plastic (N) and Ceramic (J)
300-mil DIPs
description
These devices contain four independent 2-input
NAND gates. They perform the Boolean function
Y = A
B or Y = A + B in positive logic.
The SN54HCT00 is characterized for operation
over the full military temperature range of –55
°
C
to 125
°
C. The SN74HCT00 is characterized for
operation from –40
°
C to 85
°
C.
FUNCTION TABLE
(each gate)
INPUTS
OUTPUT
Y
A
B
H
H
L
L
X
H
X
L
H
logic symbol
1
1A
2
1B
1Y
3
4
2A
5
2B
2Y
6
9
3A
10
3B
3Y
8
12
4A
13
4B
4Y
11
&
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12.
Pin numbers shown are for the D, J, N, PW, and W packages.
logic diagram (positive logic)
A
B
Y
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
1Y
2A
2B
2Y
GND
V
CC
4B
4A
4Y
3B
3A
3Y
SN54HCT00 . . . J OR W PACKAGE
SN74HCT00 . . . D, N, OR PW PACKAGE
(TOP VIEW)
3
2 1 20 19
9 10 11 12 13
4
5
6
7
8
18
17
16
15
14
4A
NC
4Y
NC
3B
1Y
NC
2A
NC
2B
1
1
N
3
3
V
4
2
G
N
SN54HCT00 . . . FK PACKAGE
(TOP VIEW)
NC – No internal connection
Copyright
1996, Texas Instruments Incorporated
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
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