參數(shù)資料
型號: SN54F158AJ
廠商: Texas Instruments, Inc.
英文描述: 8Kx8 Nonvolatile SRAM, 10% Voltage Tolerance 28-DIP MODULE 0 to 70
中文描述: 四2線1線數(shù)據(jù)選擇器/多路復(fù)用器
文件頁數(shù): 2/5頁
文件大小: 72K
代理商: SN54F158AJ
SN54F158A, SN74F158A
QUADRUPLE 2-LINE TO 1-LINE DATA SELECTORS/MULTIPLEXERS
SDFS054A – D2932, MARCH 1987 – REVISED OCTOBER 1993
2–2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
logic symbol
logic diagram (positive logic)
G
MUX
2
1A
1
3
1B
EN
15
G1
1
1Y
4
5
2A
6
2B
2Y
7
11
3A
10
3B
3Y
9
14
4A
13
4B
4Y
12
A/B
4Y
3Y
2Y
1Y
12
9
7
4
A/B
G
4B
4A
3B
3A
2B
2A
1B
1A
1
15
13
14
10
11
6
5
3
2
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Pin numbers shown are for the D, J, and N packages.
1
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
Input voltage range (see Note 1)
Input current range
Voltage range applied to any output in the high state
Current into any output in the low state
Operating free-air temperature range: SN54F158A
–0.5 V to 7 V
–1.2 V to 7 V
–30 mA to 5 mA
–0.5 V to V
CC
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SN74F158A
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
40 mA
–55
°
C to 125
°
C
0
°
C to 70
°
C
–65
°
C to 150
°
C
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: The input voltage rating may be exceeded provided that the input current rating is observed.
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