參數(shù)資料
型號: SN54BCT8374AFK
廠商: Texas Instruments, Inc.
英文描述: SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
中文描述: 掃描測試設備與八路D型邊沿觸發(fā)觸發(fā)器
文件頁數(shù): 16/26頁
文件大?。?/td> 474K
代理商: SN54BCT8374AFK
SN54BCT8374A, SN74BCT8374A
SCAN TEST DEVICES
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SCBS045E – JUNE 1990 – REVISED JULY 1996
16
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
recommended operating conditions
SN54BCT8374A
MIN
NOM
SN74BCT8374A
MIN
NOM
UNIT
MAX
MAX
VCC
VIH
VIHH
VIL
IIK
Supply voltage
4.5
5
5.5
4.5
5
5.5
V
High-level input voltage
2
2
V
Double-high-level input voltage
TMS
10
12
10
12
V
Low-level input voltage
0.8
0.8
V
Input clamp current
–18
–18
mA
IOH
High level output current
High-level output current
TDO
–3
–3
mA
Any Q
–12
–15
IOL
Low level output current
Low-level output current
TDO
20
24
mA
Any Q
48
64
TA
Operating free-air temperature
–55
125
0
70
°
C
相關PDF資料
PDF描述
SN54BCT8374AJT SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN74BCT8374ANT SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN74BCT8374ADWR Replaced by BQ20Z80A-V110 : Impedance Track (TM) 1% accurate Gas Gauge for LiIon batteries SBS1.1 compliant 38-TSSOP -40 to 85
SN74BCT8374ADWRE4 Replaced by BQ20Z80A-V110 : Impedance Track (TM) 1% accurate Gas Gauge for LiIon batteries SBS1.1 compliant 38-TSSOP -40 to 85
SN74CBT16210DGV 20-BIT FET BUS SWITCH
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