參數(shù)資料
型號: SN54AS804BFK
廠商: Texas Instruments, Inc.
英文描述: HEX 2-INPUT NAND DRIVERS
中文描述: 六角2輸入與非驅(qū)動
文件頁數(shù): 1/13頁
文件大?。?/td> 439K
代理商: SN54AS804BFK
SN54ALS804A, SN54AS804B, SN74ALS804A, SN74AS804B
HEX 2-INPUT NAND DRIVERS
SDAS022C – DECEMBER 1982 – REVISED JANUARY 1995
Copyright
1995, Texas Instruments Incorporated
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
High Capacitive-Drive Capability
ALS804A Has Typical Delay Time of 4 ns
(C
L
= 50 pF) and Typical Power Dissipation
of 3.4 mW Per Gate
AS804B Has Typical Delay Time of 2.6 ns
(C
L
= 50 pF) and Typical Power Dissipation
of Less Than 9 mW Per Gate
Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Plastic (N)
and Ceramic (J) 300-mil DIPs
description
These devices contain six independent 2-input
NAND drivers. They perform the Boolean
functions Y = A
B or Y = A + B in positive logic.
The SN54ALS804A and SN54AS804B are
characterized for operation over the full military
temperature range of –55
°
C to 125
°
C. The
SN74ALS804A
and
characterized for operation from 0
°
C to 70
°
C.
SN74AS804B
are
FUNCTION TABLE
(each driver)
INPUTS
A
OUTPUT
Y
B
H
H
L
L
X
H
X
L
H
logic symbol
logic diagram (positive logic)
1
1A
2
1B
4
2A
5
2B
7
3A
8
3B
12
4A
13
4B
&
1Y
3
2Y
6
3Y
9
4Y
11
15
5A
16
5B
18
6A
19
6B
5Y
14
6Y
17
1Y
3
1
1A
2
1B
2Y
6
4
2A
5
2B
3Y
9
7
3A
8
3B
4Y
11
12
4A
13
4B
5Y
14
15
5A
16
5B
6Y
17
18
6A
19
6B
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
1A
1B
1Y
2A
2B
2Y
3A
3B
3Y
GND
V
CC
6B
6A
6Y
5B
5A
5Y
4B
4A
4Y
SN54ALS804A, SN54AS804B . . . J PACKAGE
SN74ALS804A, SN74AS804B . . . DW OR N PACKAGE
(TOP VIEW)
3
2
1 20 19
9 10 11 12 13
4
5
6
7
8
18
17
16
15
14
6A
6Y
5B
5A
5Y
2A
2B
2Y
3A
3B
SN54ALS804A, SN54AS804B . . . FK PACKAGE
(TOP VIEW)
1
1
1
4
4
6
3
G
4
V
C
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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