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參數(shù)資料
| 型號(hào)： | SN54ABT8646FK |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
| 中文描述： | 掃描測(cè)試設(shè)備與八路總線收發(fā)器和寄存器 |
| 文件頁數(shù)： | 1/27頁 |
| 文件大?。?/td> | 388K |
| 代理商： | SN54ABT8646FK |
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SN54ABT8646, SN74ABT8646
SCAN TEST DEVICES WITH
OCTAL BUS TRANSCEIVERS AND REGISTERS
SCBS123E – AUGUST 1992 – REVISED JULY 1996
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Members of the Texas Instruments
SCOPE
Family of Testability Products
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
Functionally Equivalent to ’F646 and
’ABT646 in the Normal-Function Mode
SCOPE
Instruction Set
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
– Parallel-Signature Analysis at Inputs
With Masking Option
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Even-Parity Opcodes
Two Boundary-Scan Cells Per I/O for
Greater Flexibility
State-of-the-Art EPIC-
ΙΙ
B
BiCMOS Design
Significantly Reduces Power Dissipation
Package Options Include Plastic
Small-Outline (DW) and Shrink
Small-Outline (DL) Packages, Ceramic Chip
Carriers (FK), and Standard Ceramic DIPs
(JT)
description
The ’ABT8646 and scan test devices with octal
bus transceivers and registers are members of the
Texas
Instruments
integrated-circuit family. This family of devices
supports IEEE Standard 1149.1-1990 boundary
scan to facilitate testing of complex circuit-board
assemblies. Scan access to the test circuitry is
accomplished via the 4-wire test access port
(TAP) interface.
SCOPE
testability
In the normal mode, these devices are functionally equivalent to the ’F646 and ’ABT646 octal bus transceivers
and registers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing
at the device pins or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does
not affect the functional operation of the SCOPE
octal bus transceivers and registers.
Copyright
1996, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE and EPIC-
ΙΙ
B are trademarks of Texas Instruments Incorporated.
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CLKAB
SAB
DIR
A1
A2
A3
GND
A4
A5
A6
A7
A8
TDO
TMS
CLKBA
SBA
OE
B1
B2
B3
B4
V
CC
B5
B6
B7
B8
TDI
TCK
3 2 1
13 14
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7
8
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11
B7
B8
TDI
TCK
TMS
TDO
A8
OE
SBA
CLKBA
CLKAB
SAB
DIR
A1
4
15 16 17 18
A
G
A
A
A
A
B
B
B
B
28 27 2625
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12
A
V
B
B
C
SN54ABT8646 . . . JT PACKAGE
SN74ABT8646 . . . DL OR DW PACKAGE
(TOP VIEW)
SN54ABT8646 . . . FK PACKAGE
(TOP VIEW)
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABT8646JT | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
| SN54ABT8652 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
| SN54ABT8652_07 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
| SN54ABT8652FK | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
| SN54ABT8652JT | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
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