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參數(shù)資料
| 型號： | SN54ABTH18502AHV |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
| 中文描述： | 掃描測試設備與18位通用總線收發(fā)器 |
| 文件頁數(shù)： | 1/37頁 |
| 文件大?。?/td> | 549K |
| 代理商： | SN54ABTH18502AHV |
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SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A
SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS164E – AUGUST 1993 – REVISED DECEMBER 1996
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Members of the Texas Instruments
SCOPE
Family of Testability Products
Members of the Texas Instruments
Widebus
Family
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port
and Boundary-Scan Architecture
UBT
(Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
Bus Hold on Data Inputs Eliminates the
Need for External Pullup Resistors
B-Port Outputs of ’ABTH182502A Devices
Have Equivalent 25-
Series Resistors, So
No External Resistors Are Required
State-of-the-Art EPIC-
ΙΙ
B
BiCMOS Design
One Boundary-Scan Cell Per I/O
Architecture Improves Scan Efficiency
SCOPEInstruction Set
– IEEE Standard 1149.1-1990 Required
Instructions and Optional CLAMP and
HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
Packaged in 64-Pin Plastic Thin Quad Flat
(PM) Packages Using 0.5-mm
Center-to-Center Spacings and 68-Pin
Ceramic Quad Flat (HV) Packages Using
25-mil Center-to-Center Spacings
V
N
T
1
1
1
1
G
1
1
T
1
1
G
1
1
1
C
1B4
1B5
1B6
GND
1B7
1B8
1B9
V
CC
NC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
1A3
1A4
1A5
GND
1A6
1A7
1A8
1A9
NC
V
CC
2A1
2A2
2A3
GND
2A4
2A5
2A6
N
T
2
2
2
G
2
2
2
T
2
2
G
2
2
2
SN54ABTH18502A, SN54ABTH182502A . . . HV PACKAGE
(TOP VIEW)
C
V
NC – No internal connection
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
28 29 30 31 32 33 34
8 7
6
5
4
9
3
1 68 67
2
35 36 37 38 39
66 65
27
64 63 62 61
40 41 42 43
Copyright
1996, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
DATA information current as of publication date. Products conform to
specifications per the terms of Texas Instruments standard warranty.
parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, Widebus, UBT, and EPIC-
ΙΙ
B are trademarks of Texas Instruments Incorporated.
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|---|---|
| SN54ABTH182502A | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
| SNJ54ABTH18502A | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABTH182502AHV | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABTH18504AHV | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABTH182504AHV | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABTH18504A | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABTH18504A_08 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABTH18504AHV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN54ABTH18646A | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| SN54ABTH18646AHV | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
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