參數(shù)資料
型號： SN54ABT18502A
廠商： Texas Instruments, Inc.
英文描述： Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測試裝置(帶18位通用總線收發(fā)器))
中文描述： 掃描測試設(shè)備與18位通用總線收發(fā)器（掃描測試裝置（帶18位通用總線收發(fā)器））
文件頁數(shù)： 2/35頁
文件大?。?/td> 738K
代理商： SN54ABT18502A
SN54ABT18502A, SN54ABT182502A, SN74ABT18502A, SN74ABT182502A
SCAN TEST DEVICES WITH
18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS488 – AUGUST 1994
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
18 19
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63 62 61 60 59
64
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G
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T
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T
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1A3
1A4
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GND
1A6
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CC
2A1
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GND
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GND
1B7
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CC
2B1
2B2
2B3
2B4
GND
2B5
2B6
2B7
C
SN74ABT18502A, SN74ABT182502A . . . PM PACKAGE
(TOP VIEW)
description
The
′
ABT18502A and
′
ABT182502A scan test devices with 18-bit universal bus transceivers are members of
the Texas Instruments SCOPE
testability integrated circuit family. This family of devices supports IEEE
Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to
the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
In the normal mode, these devices are 18-bit universal bus transceivers that combine D-type latches and D-type
flip-flops to allow data flow in transparent, latched, or clocked modes. They can be used either as two 9-bit
transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot samples
of the data appearing at the device pins or to perform a self test on the boundary test cells. Activating the TAP
in the normal mode does not affect the functional operation of the SCOPE
universal bus transceivers.
Data flow in each direction is controlled by output-enable (OEAB and OEBA), latch-enable (LEAB and LEBA),
and clock (CLKAB and CLKBA) inputs. For A-to-B data flow, the device operates in the transparent mode when
LEAB is high. When LEAB is low, the A-bus data is latched while CLKAB is held at a static low or high logic level.
Otherwise, if LEAB is low, A-bus data is stored on a low-to-high transition of CLKAB. When OEAB is low, the
B outputs are active. When OEAB is high, the B outputs are in the high-impedance state. B-to-A data flow is
similar to A-to-B data flow but uses the OEBA, LEBA, and CLKBA inputs.
In the test mode, the normal operation of the SCOPE
universal bus transceivers is inhibited, and the test
circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry
performs boundary scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
P
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