參數(shù)資料
型號(hào): SL1ICS3101
廠商: NXP Semiconductors N.V.
英文描述: I.CODE1 Label IC 97pF Chip Specification
中文描述: I.CODE1標(biāo)簽IC 97pF芯片規(guī)格
文件頁數(shù): 17/22頁
文件大?。?/td> 373K
代理商: SL1ICS3101
Product Specification
SL1 ICS31 01
Rev. 1.2
July 2000
Page 17 of 22
Public
15 Inlet/Label Characterisation and Test
15.1 Characterisation of the Inlet/Label
The parameters recommended to be characterised for the inlet/label are:
Parameter
Symbol
Conditions
Threshold field strength for
UNSELECTED READ command
(standard mode)
H
TRead
UNSELECTED READ command OK
Threshold resonance frequency
f
RT
Resonance frequency @ H
TRead
No command transmitted to the inlet/label
à
Label generates no response
à
No modulation
Threshold field strength for WRITE
command
(standard mode)
H
TWrite
WRITE (and Verifying READ) command OK
For more detailed information on inlet /label characterisation please refer to Philips application note
‘ICODE Label IC, Coil Design Guide’.
15.2 Final Test of the Inlet/Label
Basic flow for production and test:
1.
Production of wafer
2.
Testing of dies on wafer
3.
Writing of serial numbers and pre-configuration
4.
Sawing of wafer
5.
Assembly of inlets/labels
6.
Final test of inlets/labels
7.
Writing of customer data
To detect damage of EEPROM cells during production of inlets/labels a final test of the
EEPROM after assembly of the inlet/label is recommended. This is necessary to achieve
lowest failure rates.
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