Si5369
10
Rev. 1.0
Output Rise/Fall
(20–80%) @
212.5 MHz output
CKOTRF
CMOS Output
VDD =1.71
CLOAD =5 pF
——
8
ns
Output Rise/Fall
(20–80%) @
212.5 MHz output
CKOTRF
CMOS Output
VDD =2.97
CLOAD =5 pF
——
2
ns
Output Duty Cycle
Uncertainty @
622.08 MHz
CKODC
100
Load
Line-to-Line
Measured at 50% Point
(Not for CMOS)
——
±40
ps
LVCMOS Input Pins
Minimum Reset Pulse
Width
tRSTMN
1—
s
Reset to Microproces-
sor Access Ready
tREADY
——
10
ms
Input Capacitance
Cin
——
3
pF
LVCMOS Output Pins
Rise/Fall Times
tRF
CLOAD = 20pf
—25
—
ns
LOSn Trigger Window
LOSTRIG
From last CKINn
to
Internal detection of LOSn
N3
≠ 1
—
4.5 x N3
TCKIN
Time to Clear LOL
after LOS Cleared
tCLRLOL
LOS to LOL
Fold = Fnew
Stable Xa/XB reference
—10
—
ms
Device Skew
Output Clock Skew
tSKEW
of CKOUTn to of
CKOUT_m, CKOUTn
and CKOUT_m at same
frequency and signal
format
PHASEOFFSET =0
CKOUT_ALWAYS_ON =1
SQ_ICAL =1
——
100
ps
Table 3. AC Specifications (Continued)
(VDD = 1.8 ± 5%, 2.5 ±10%, or 3.3 V ±10%, TA = –40 to 85 °C)
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Notes:
1. Input to output phase skew after an ICAL is not controlled and can assume any value.
2. Lock and settle time performance is dependent on the frequency plan and the XAXB reference frequency. Please visit
the Silicon Labs Technical Support web page at: https://www.silabs.com/support/pages/contacttechnicalsupport.aspx
to submit a technical support request regarding the lock time of your frequency plan.