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參數(shù)資料
型號: SI3216DCQX-EVB
廠商: Silicon Laboratories Inc
文件頁數(shù): 33/122頁
文件大?。?/td> 0K
描述: DAUGHTER CARD W/DISCRETE INTRFC
標準包裝: 1
系列: ProSLIC®
主要目的: 接口,模擬前端(AFE)
已用 IC / 零件: Si3216
已供物品: 板,CD
Si3216
18
Rev. 1.0
Not
Recommended
fo
r N
ew
D
esi
gn
s
Table 10. Switching Characteristics—General Inputs
VDDA =VDDA = 3.13 to 5.25 V, TA = 0 to 70 °C for K-Grade, –40 to 85 °C for B-Grade, CL =20pF)
Parameter
Symbol
Min
Typ
Max
Unit
Rise Time, RESET
tr
——
20
ns
RESET Pulse Width
trl
100
ns
Note: All timing (except Rise and Fall time) is referenced to the 50% level of the waveform. Input test levels are
VIH =VD – 0.4 V, VIL = 0.4 V. Rise and Fall times are referenced to the 20% and 80% levels of the waveform.
Table 11. Switching Characteristics—SPI
VDDA =VDDA = 3.13 to 5.25 V, TA = 0 to 70 °C for K-Grade, –40 to 85 °C for B-Grade, CL =20pF
Parameter
Symbol
Test
Conditions
Min
Typ
Max
Unit
Cycle Time SCLK
tc
0.062
s
Rise Time, SCLK
tr
25
ns
Fall Time, SCLK
tf
25
ns
Delay Time, SCLK Fall to SDO Active
td1
20
ns
Delay Time, SCLK Fall to SDO
Transition
td2
20
ns
Delay Time, CS Rise to SDO Tri-state
td3
20
ns
Setup Time, CS to SCLK Fall
tsu1
25
ns
Hold Time, CS to SCLK Rise
th1
20
ns
Setup Time, SDI to SCLK Rise
tsu2
25
ns
Hold Time, SDI to SCLK Rise
th2
20
ns
Delay Time between Chip Selects
(Continuous SCLK)
tcs
440
ns
Delay Time between Chip Selects
(Non-continuous SCLK)
tcs
220
ns
SDI to SDITHRU Propagation Delay
td4
4
10
ns
Note: All timing is referenced to the 50% level of the waveform. Input test levels are VIH =VDDD –0.4 V, VIL =0.4 V
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