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參數(shù)資料
| 型號： | SCAN921025HSM |
| 廠商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分類： | 通用總線功能 |
| 英文描述： | High Temperature 20-80 MHz 10 Bit Bus LVDS SerDes with IEEE 1149.1 (JTAG) and at-speed BIST |
| 中文描述： | LINE DRIVER, PBGA49 |
| 封裝： | BGA-49 |
| 文件頁數(shù)： | 3/21頁 |
| 文件大?。?/td> | 527K |
| 代理商： | SCAN921025HSM |
Data Transfer
(Continued)
high, PWRDN = high, and SYNC1 and SYNC2 are low.
When DEN is driven low, the Serializer output pins will enter
TRI-STATE.
When the Deserializer synchronizes to the Serializer, the
LOCK pin is low. The Deserializer locks to the embedded
clock and uses it to recover the serialized data. ROUT data
is valid when LOCK is low. Otherwise ROUT0–ROUT9 is
invalid.
The ROUT0-ROUT9 pins use the RCLK pin as the reference
to data. The polarity of the RCLK edge is controlled by the
RCLK_R/F input. See
Figure 13
.
ROUT(0-9), LOCK and RCLK outputs will drive a maximum
of three CMOS input gates (15 pF load) with a 80 MHz clock.
Resynchronization
When the Deserializer PLL locks to the embedded clock
edge, the Deserializer LOCK pin asserts a low. If the Dese-
rializer loses lock, the LOCK pin output will go high and the
outputs (including RCLK) will enter TRI-STATE.
The user’s system monitors the LOCK pin to detect a loss of
synchronization. Upon detection, the system can arrange to
pulse the Serializer SYNC1 or SYNC2 pin to resynchronize.
Multiple resynchronization approaches are possible. One
recommendation is to provide a feedback loop using the
LOCK pin itself to control the sync request of the Serializer
(SYNC1 or SYNC2). Dual SYNC pins are provided for mul-
tiple control in a multi-drop application. Sending sync pat-
terns for resynchronization is desirable when lock times
within a specific time are critical. However, the Deserializer
can lock to random data, which is discussed in the next
section.
Random Lock Initialization and
Resynchronization
The initialization and resynchronization methods described
in their respective sections are the fastest ways to establish
the link between the Serializer and Deserializer. However,
the SCAN921226H can attain lock to a data stream without
requiring the Serializer to send special SYNC patterns. This
allows the SCAN921226H to operate in “open-loop” applica-
tions. Equally important is the Deserializer’s ability to support
hot insertion into a running backplane. In the open loop or
hot insertion case, we assume the data stream is essentially
random. Therefore, because lock time varies due to data
stream characteristics, we cannot possibly predict exact lock
time. However, please see
Table 1
for some general random
lock times under specific conditions. The primary constraint
on the “random” lock time is the initial phase relation be-
tween the incoming data and the REFCLK when the Dese-
rializer powers up. As described in the next paragraph, the
data contained in the data stream can also affect lock time.
If a specific pattern is repetitive, the Deserializer could enter
“false lock” - falsely recognizing the data pattern as the
clocking bits. We refer to such a pattern as a repetitive
multi-transition, RMT. This occurs when more than one Low-
High transition takes place in a clock cycle over multiple
cycles. This occurs when any bit, except DIN 9, is held at a
low state and the adjacent bit is held high, creating a 0-1
transition. In the worst case, the Deserializer could become
locked to the data pattern rather than the clock. Circuitry
within the SCAN921226H can detect that the possibility of
“false lock” exists. The circuitry accomplishes this by detect-
ing more than one potential position for clocking bits. Upon
detection, the circuitry will prevent the LOCK output from
becoming active until the potential “false lock” pattern
changes. The false lock detect circuitry expects the data will
eventually change, causing the Deserializer to lose lock to
the data pattern and then continue searching for clock bits in
the serial data stream. Graphical representations of RMT are
shown in
Figure 1
. Please note that RMT only applies to bits
DIN0-DIN8.
Powerdown
When no data transfer occurs, you can use the Powerdown
state. The Serializer and Deserializer use the Powerdown
state, a low power sleep mode, to reduce power consump-
tion. The Deserializer enters Powerdown when you drive
PWRDN and REN low. The Serializer enters Powerdown
when you drive PWRDN low. In Powerdown, the PLL stops
and the outputs enter TRI-STATE, which disables load cur-
rent and reduces supply current to the milliampere range. To
exit Powerdown, you must drive the PWRDN pin high.
Before valid data exchanges between the Serializer and
Deserializer, you must reinitialize and resynchronize the de-
vices to each other. Initialization of the Serializer takes 510
TCLK cycles. The Deserializer will initialize and assert LOCK
high until lock to the Bus LVDS clock occurs.
TRI-STATE
The Serializer enters TRI-STATE when the DEN pin is driven
low. This puts both driver output pins (DO+ and DO) into
TRI-STATE. When you drive DEN high, the Serializer returns
to the previous state, as long as all other control pins remain
static (SYNC1, SYNC2, PWRDN, TCLK_R/F).
When you drive the REN pin low, the Deserializer enters
TRI-STATE.
Consequently,
(ROUT0–ROUT9) and RCLK will enter TRI-STATE. The
LOCK output remains active, reflecting the state of the PLL.
the
receiver
output
pins
TABLE 1.
Random Lock Times for the SCAN921226H
80 MHz
Maximum
Mean
Minimum
Conditions:
PRBS 2
15
, V
CC
= 3.3V
1) Difference in lock times are due to different starting points in the data
pattern with multiple parts.
Units
μs
μs
μs
18
3.0
0.43
Test Modes
In addition to the IEEE 1149.1 test access to the digital TTL
pins, the SCAN921025H and SCAN921226H have two in-
structions to test the LVDS interconnects. The first is EX-
TEST. This is implemented at LVDS levels and is only in-
tended as a go no-go test (e.g. missing cables). The second
method is the RUNBIST instruction. It is an "at-system-
speed" interconnect test. It is executed in approximately
28mS with a system clock speed of 80MHz. There are two
bits in the RX BIST data register for notification of PASS/
FAIL and TEST_COMPLETE. Pass indicates that the BER
(Bit-Error-Rate) is better than 10
-7
.
An important detail is that once both devices have the RUN-
BIST instruction loaded into their respective instruction reg-
isters, both devices must move into the RTI state within 4K
S
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3
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相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| SCAN921025HSM/NOPB | 功能描述:LVDS 接口集成電路 High Tem 20MHz-80 MHz 10B Serializer RoHS:否 制造商:Texas Instruments 激勵器數(shù)量:4 接收機數(shù)量:4 數(shù)據(jù)速率:155.5 Mbps 工作電源電壓:5 V 最大功率耗散:1025 mW 最大工作溫度:+ 85 C 封裝 / 箱體:SOIC-16 Narrow 封裝:Reel |
| SCAN921025HSMX | 功能描述:LVDS 接口集成電路 RoHS:否 制造商:Texas Instruments 激勵器數(shù)量:4 接收機數(shù)量:4 數(shù)據(jù)速率:155.5 Mbps 工作電源電壓:5 V 最大功率耗散:1025 mW 最大工作溫度:+ 85 C 封裝 / 箱體:SOIC-16 Narrow 封裝:Reel |
| SCAN921025HSMX/NOPB | 功能描述:LVDS 接口集成電路 RoHS:否 制造商:Texas Instruments 激勵器數(shù)量:4 接收機數(shù)量:4 數(shù)據(jù)速率:155.5 Mbps 工作電源電壓:5 V 最大功率耗散:1025 mW 最大工作溫度:+ 85 C 封裝 / 箱體:SOIC-16 Narrow 封裝:Reel |
| SCAN921025SLC | 功能描述:LVDS 接口集成電路 RoHS:否 制造商:Texas Instruments 激勵器數(shù)量:4 接收機數(shù)量:4 數(shù)據(jù)速率:155.5 Mbps 工作電源電壓:5 V 最大功率耗散:1025 mW 最大工作溫度:+ 85 C 封裝 / 箱體:SOIC-16 Narrow 封裝:Reel |
| SCAN921025SLC/NOPB | 功能描述:LVDS 接口集成電路 RoHS:否 制造商:Texas Instruments 激勵器數(shù)量:4 接收機數(shù)量:4 數(shù)據(jù)速率:155.5 Mbps 工作電源電壓:5 V 最大功率耗散:1025 mW 最大工作溫度:+ 85 C 封裝 / 箱體:SOIC-16 Narrow 封裝:Reel |
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