參數(shù)資料
型號(hào): SC16C2550BIN40,112
廠商: NXP Semiconductors
文件頁數(shù): 26/31頁
文件大?。?/td> 0K
描述: IC UART DUAL W/FIFO 40-DIP
標(biāo)準(zhǔn)包裝: 9
特點(diǎn): 故障啟動(dòng)位檢測
通道數(shù): 2,DUART
FIFO's: 16 字節(jié)
電源電壓: 2.5V,3.3V,5V
帶自動(dòng)流量控制功能:
帶故障啟動(dòng)位檢測功能:
帶調(diào)制解調(diào)器控制功能:
帶CMOS:
安裝類型: 通孔
封裝/外殼: 40-DIP(0.600",15.24mm)
供應(yīng)商設(shè)備封裝: 40-DIP
包裝: 管件
其它名稱: 935274404112
SC16C2550BIN40
SC16C2550BIN40-ND
43
2570N–AVR–05/11
ATmega325/3250/645/6450
Figure 11-3. MCU Start-up, RESET Extended Externally
11.4
External Reset
An External Reset is generated by a low level on the RESET pin. Reset pulses longer than the
minimum pulse width (see “System and Reset Characteristics” on page 301) will generate a
reset, even if the clock is not running. Shorter pulses are not guaranteed to generate a reset.
When the applied signal reaches the Reset Threshold Voltage – V
RST – on its positive edge, the
delay counter starts the MCU after the Time-out period – t
TOUT – has expired.
Figure 11-4. External Reset During Operation
11.5
Brown-out Detection
Atmel ATmega325/3250/645/6450 has an On-chip Brown-out Detection (BOD) circuit for moni-
toring the V
CC level during operation by comparing it to a fixed trigger level. The trigger level for
the BOD can be selected by the BODLEVEL Fuses. The trigger level has a hysteresis to ensure
spike free Brown-out Detection. The hysteresis on the detection level should be interpreted as
V
BOT+ = VBOT + VHYST/2 and VBOT- = VBOT - VHYST/2. When the BOD is enabled, and VCC
decreases to a value below the trigger level (V
BOT- in Figure 11-5 on page 44), the Brown-out
Reset is immediately activated. When V
CC increases above the trigger level (VBOT+ in Figure 11-
5 on page 44), the delay counter starts the MCU after the Time-out period t
TOUT has expired.
The BOD circuit will only detect a drop in V
CC if the voltage stays below the trigger level for lon-
ger than t
RESET
TIME-OUT
INTERNAL
RESET
t
TOUT
V
POT
V
RST
VCC
CC
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