參數(shù)資料
型號： SAA5497PS/NNN
廠商： NXP SEMICONDUCTORS
元件分類： 微控制器/微處理器
英文描述： 8-BIT, MROM, 12 MHz, MICROCONTROLLER, PDIP52
封裝： 0.600 INCH, PLASTIC, SDIP-52
文件頁數(shù)： 60/72頁
文件大?。?/td> 498K
代理商： SAA5497PS/NNN
1998 Dec 14
63
Philips Semiconductors
Preliminary specication
Economy teletext and TV microcontrollers
SAA5x9x family
14 QUALITY AND RELIABILITY
This device will meet Philips Semiconductors General Quality Specification for Business group
“Consumer Integrated
Circuits SNW-FQ-611-Part E”; “Quality Reference Handbook, order number 9398 510 63011”. The principal
requirements are shown in Table 25 to 28.
Table 25 Acceptance tests per lot; note 1
Table 26 Processability tests (by package family); note 2
Table 27 Reliability tests (by process family); note 3
Table 28 Reliability tests (by device type)
Notes to Tables 25, 26 and 27
1. ppm = fraction of defective devices, in parts per million.
2. LTPD = Lot Tolerance Percent Defective.
3. FPM = fraction of devices failing at test condition, in failures per million.
TEST
REQUIREMENTS
Mechanical
cumulative target: <80 ppm
Electrical
cumulative target: <80 ppm
TEST
REQUIREMENTS
solderability
<7% LTPD
mechanical
<15% LTPD
solder heat resistance
<15% LTPD
TEST
CONDITIONS
REQUIREMENTS
operational life
168 hours at Tj = 150 °C
<1000 FPM at Tj =70 °C
humidity life
temperature, humidity, bias 1000 hours, 85
°C, 85% RH
(or equivalent test)
<2000 FPM
temperature cycling
performance
Tstg(min) to Tstg(max)
<2000 FPM
TEST
CONDITIONS
REQUIREMENTS
ESD and latch-up
ESD Human body model 100 pF, 1.5 k
2000 V
ESD Machine model 200 pF, 0
200 V
latch-up
100 mA, 1.5
× VDD (absolute maximum)
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