參數(shù)資料
型號: SA5217
廠商: NXP Semiconductors N.V.
英文描述: Postamplifier with link status indicator
中文描述: 后置連接狀態(tài)指示燈與
文件頁數(shù): 5/12頁
文件大小: 98K
代理商: SA5217
Philips Semiconductors
Product specification
SA5217
Postamplifier with link status indicator
1998 Oct 07
5
AC ELECTRICAL CHARACTERISTICS
Min and Max limits apply over the operating temperature range at V
CCA
= V
CCD
= +5.0V unless otherwise specified. Typical data applies at
V
CCA
= V
CCD
= +5.0V and T
A
= 25
°
C.
SYMBOL
PARAMETER
TEST CONDITIONS
LIMITS
Typ
75
UNIT
Min
60
Max
f
OP
Maximum operating frequency
Maximum Functional A1 input signal (single en-
ded)
Minimum Functional A1 input signal (single-en-
ded)
Minimum Functional A1 input signal (differential)
Minimum input sensitivity for output BER
10
–9
(single-ended)
Minimum input sensitivity for output BER
10
–9
(differential)
Input resistance (differential at IN
1
)
Input capacitance (differential at IN
1
)
Input resistance (differential at IN
2
)
Input capacitance (differential at IN
2
)
Output resistance (differential at OUT
2
)
Output capacitance (differential at OUT
2
)
Hysteresis voltage range (single-ended)
Hysteresis voltage range (differential)
Test circuit
MHz
V
INH
Test Circuit
1.6
V
P-P
Test CIrcuit
6
mV
P-P
3
P P
V
INL
PRBS = 2
23
–1
9
mV
P-P
4.5
R
IN1
C
IN1
R
IN8
C
IN2
R
OUT2
C
OUT2
PRBS = 2
23
–1
1200
2
2000
2
25
2
10
5
pF
pF
pF
V
HYS
Test circuit, T
= 25
°
C
R
RHYST
=5k R
THRESH
=33k
(FLAG Low) Test circuit,
@ 50MHz
R
RHYST
=4k R
THRESH
=33k
Test Circuit
Test Circuit
mV
P-P
A
V
THR
Threshold voltage (single-ended)
19
mV
P-P
Threshold voltage (differential)
TTL Output Rise Time 20% to 80%
TTL Output Fall Time 80% to 20%
t
TLH
/t
THL
mismatch
9.5
1.3
1.2
0.1
P P
t
TLH
t
THL
t
RFD
ns
ns
ns
t
PWD
Pulse width distortion of output
50mV
P-P
, 1010. . .input
T
H
T
H
Distortion =
T
L
T
L
10
2
TBD
%
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
NE5217
LED
C
PKDET
THRESH
GND
A
FLAG
JAM
125
33k
15pF
400
10k
4k
25
50
V
+5V
V
IN
V
OUT
V
OUT
GND
D
V
CCA
V
CCD
IN
1B
IN
1A
C
AZP
C
AZN
OUT
2B
IN
8B
OUT
2A
IN
8A
R
HYST
R
PKDET
0.1
μ
F
0.1
μ
F
0.1
μ
F
0.1
μ
F
0.1
μ
F
0.1
μ
F
0.1
μ
F
10
μ
F
100
μ
H
100
μ
H
SD00356
Figure 3. AC Test Circuit
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