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128
pSRAM Type 7
pSRAM_Type07_13_A0 May 4, 2004
Prelimin ary
Absolute Maximum Ratings
WARNING: Semiconductor devices can be permanently damaged by application of stress (voltage, current, temperature,
etc.) in excess of absolute maximum ratings. Do not exceed these ratings.
Recommended Operating Conditions (See Warning Below)
Notes:
1. Maximum DC voltage on input and I/O pins are VDD+0.2V. During voltage transitions, inputs may positive overshoot to
VDD+1.0V for periods of up to 5 ns.
2. Minimum DC voltage on input or I/O pins are -0.3V. During voltage transitions, inputs may negative overshoot VSS to -1.0V
for periods of up to 5ns.
WARNING: Recommended operating conditions are normal operating ranges for the semiconductor device. All the de-
vice’s electrical characteristics are warranted when operated within these ranges.
Always use semiconductor devices within the recommended operating conditions. Operation outside these ranges may
adversely affect reliability and could result in device failure.
No warranty is made with respect to uses, operating conditions, or combinations not represented on the data sheet.
Users considering application outside the listed conditions are advised to contact their FUJITSU representative before-
hand.
Package Capacitance
Test conditions: TA = 25°C, f = 1.0 MHz
Item
Symbol
Value
Unit
Voltage of VDD Supply Relative to VSS
VDD
-0.5 to +3.6
V
Voltage at Any Pin Relative to VSS
VIN, VOUT
-0.5 to +3.6
V
Short Circuit Output Current
IOUT
±50
mA
Storage temperature
TSTG
-55 to +125
°C
Parameter
Symbol
Min
Max
Unit
Supply Voltage
VDD
2.7
3.1
V
VSS
0
V
High Level Input Voltage (Note 1)
VIH
VDD 0.8
VDD+0.2
V
High Level Input Voltage (Note 1)
VIL
-0.3
VDD 0.2
V
Ambient Temperature
TA
-30
85
°C
Symbol
Description
Test Setup
Typ
Max
Unit
CIN1
Address Input Capacitance
VIN = 0V
—
5
pF
CIN2
Control Input Capacitance
VIN = 0V
—
5
pF
CIO
Data Input/Output Capacitance
VIO = 0V
—
8
pF