參數(shù)資料
型號(hào): RN4910
廠商: Toshiba Corporation
英文描述: Silicon PNP Epitaxial Type (PCT Process) Silicon NPN Epitaxial Type (PCT Process)
中文描述: 硅外延式進(jìn)步黨(厘進(jìn)程)npn型硅外延型(厘進(jìn)程)
文件頁(yè)數(shù): 3/6頁(yè)
文件大?。?/td> 180K
代理商: RN4910
RN4910
2001-06-07
3
Q1 Electrical Characteristics
(Ta = 25°C)
Characteristic
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
Collector cut-off current
I
CBO
V
CB
=
50V, I
E
= 0
100
nA
Emitter cut-off current
I
EBO
V
EB
=
5V, I
C
= 0
100
mA
DC current gain
h
FE
V
CE
=
5V, I
C
=
1mA
120
400
Collector-emitter saturation voltage
V
CE (sat)
I
C
=
5mA, I
B
=
0.25mA
0.1
0.3
V
Transition frequency
f
T
V
CE
=
10V, I
C
=
5mA
200
MHz
Collector output capacitance
C
ob
V
CB
=
10V, I
E
= 0, f = 1MHz
3
6
pF
Q2 Electrical Characteristics
(Ta = 25°C)
Characteristic
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
Collector cut-off current
I
CBO
V
CB
= 50V, I
E
= 0
100
nA
Emitter cut-off current
I
EBO
V
EB
= 5V, I
C
= 0
100
mA
DC current gain
h
FE
V
CE
= 5V, I
C
= 1mA
120
700
Collector-emitter saturation voltage
V
CE (sat)
I
C
= 5mA, I
B
= 0.25mA
0.1
0.3
V
Transition frequency
f
T
V
CE
= 10V, I
C
= 5mA
250
MHz
Collector output capacitance
C
ob
V
CB
= 10V, I
E
= 0, f = 1 MHz
3
6
pF
Q1, Q2 Common Electrical Characteristics
(Ta = 25°C)
Characteristic
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
Input resistor
R1
3.29
4.7
6.11
k
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