參數(shù)資料
型號(hào)： RE46C180S16TF
廠商： Microchip Technology
文件頁(yè)數(shù)： 17/58頁(yè)
文件大?。?/td> 851K
描述： IC ION SMOKE DETECT ASIC 16SOIC
標(biāo)準(zhǔn)包裝： 2,600
系列： *
?2011 Microchip Technology Inc.
DS22275A-page 17
RE46C180
4.1
Calibration and Programming
Procedures
Sixteen separate programming and Test modes are
available for user customization. The T2 input is used
to enter these modes and step through them. To enter
these modes, after power-up, T2 must be driven to V
DD
and held at that level. To step through the modes, the
TEST input must first be driven to V
DD
. T2 is then
clocked. TEST has to be high when clocking T2. Any-
time T2 and TEST are both driven to low, the unit will
come out of these modes and go back to the normal
operation mode. FEED and IO are re-configured to
become Test mode inputs. A T2 clock occurs when it
switches from V
SS
 to V
DD
. The Test mode functions are
outlined in the Table 4-7.
TABLE 4-6:
FEATURE PROGRAMMING
Features
Options
Low Battery Detection Selection
6.9V
7.2V
7.5V
7.8V
10 Year End-of-Life Indicator
Enable/Disable
Smart IO with CO
Alarm Sensing
Enable/Disable
Auto Alarm Locate
Enable/Disable
Horn Synchronization
Enable/Disable
Low Battery Hush
Enable/Disable
Alarm Memory Indicator at PTT:
Horn Chirping
Enable/Disable
Alarm Memory Indicator at PTT:
GLED Flashing
Enable/Disable
Alarm Memory Indicator at
Standby Time Out Period
0/24/48 hr or no
limit
Alarm Memory
Enable/Disable
HUSH Time Out Period
9 minutes or 80s
Smart HUSH
Enable/Disable
HUSH In Alarm Only
Enable/Disable
HUSH
Enable/Disable
Tone Select
Temporal
or Continuous
TABLE 4-7:
TEST MODE FUNCTIONS
Mode
Descriptions
T2
Clock
TEST
T2
FEED
IO
T3
TESTOUT
M0
Note 1
Normal Operation
0
PTT/HUSH
0
FEED
IO
Not Used
IO Dump
Note 2
TM0    Speedup Mode
1
PTT/HUSH
V
DD
CLK
IO
Not Used
IO Dump
Note 2
TM1    Load Timer for Spill
2
EOL Timer Clock    V
DD
HUSH/LB HUSH
Timer Clock
Alarm Mem
Timer Clock
Not Used
Not Used
TM2    User Feature
Programming
3
ProgData
V
DD
ProgClk
ProgEn
Not Used
Not Used
TM3    Horn Test/LED On;
IO High/Low
4
HornEnB
Note 3
V
DD
IOHi En
IO Dump EnB
HB/HS En
Note 4
LEDEn
Not Used
Not Used
TM4    Standby Sen Set
5
SmkCompEnB
T3EnB
V
DD
CalClk
ReadReg
V
SEN
SmkCompOut
Note 5
TM5    Hyst Sen Set
6
SmkCompEnB
T3EnB
V
DD
CalClk
ReadReg
V
SEN
SmkCompOut
Note 5
Note  1:   After power-up, the unit is in M0, the normal operation mode. When in M0, if T2 is driven to V
DD
, the unit
will enter TM0.
2:   In M0 and TM0, the digital output TESTOUT is driven by the internal IO dump signal.
3:   In TM3, if TEST = V
SS
, the horn is turned on. IO is in weak pull-down; If TEST = V
DD
, the horn is off. FEED
controls IO and HB/HS.
4:   Valid when TEST = V
DD
;
5:   SmkCompOut  digital comparator output (high if DETECT < V
SEN
; low if DETECT > V
SEN
).
6:   LBCompOut  digital comparator output (high if V
DD
 < LB trip point; low if V
DD
 > LB trip point).
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