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參數(shù)資料
| 型號(hào)： | PLV16V8 |
| 廠商： | Lattice Semiconductor Corporation |
| 英文描述： | Low Voltage, Zero Power 20-Pin EE CMOS Universal Programmable Array Logic |
| 中文描述： | 低電壓，零功率20引腳電子工程的CMOS通用可編程陣列邏輯 |
| 文件頁數(shù)： | 11/22頁 |
| 文件大?。?/td> | 425K |
| 代理商： | PLV16V8 |
PALLV16V8-10 (Com’l)
11
ABSOLUTE MAXIMUM RATINGS
Storage Temperature. . . . . . . . . . . . . .-65
°
C to +150
°
C
Ambient Temperature
with Power Applied . . . . . . . . . . . . . .-55
°
C to +125
°
C
Supply Voltage with
Respect to Ground . . . . . . . . . . . . . . .-0.5 V to +7.0 V
DC Input Voltage . . . . . . . . . . . . . . . . .-0.5 V to 5.5 V
DC Output or I/O
Pin Voltage. . . . . . . . . . . . . . . . . . . . . .-0.5 V to 5.5 V
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Latch-up Current
(T
A
= 0
°
C to 75
°
C) . . . . . . . . . . . . . . . . . . . . .100 mA
Stresses above those listed under Absolute Maximum Ratings
may cause permanent device failure. Functionality at or above
these limits is not implied. Exposure to Absolute Maximum
Ratings for extended periods may affect device reliability.
Programming conditions may differ.
OPERATING RANGES
Commercial (C) Devices
Ambient Temperature (T
A
)
Operating in Free Air. . . . . . . . . . . . . . . 0
°
C to +75
°
C
Supply Voltage (V
CC
)
with Respect to Ground. . . . . . . . . . . +3.0 V to +3.6 V
Operating ranges define those limits between which the
functionality of the device is guaranteed.
DC CHARACTERISTICS OVER COMMERCIAL OPERATING RANGES
Notes:
1. These are absolute values with respect to device ground, and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of I
IL
and I
OZL
(or I
IL
and I
OZL
).
3. Not more than one output should be shortened at a time, and the duration of the short-circuit should not exceed one second.
V
OUT
= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
4. This parameter is guaranteed worst case under test conditions. Refer to the I
CC
vs. frequency graph for typical measurements.
Parameter
Symbol
Parameter Description
Test Conditions
Min
Max
Unit
V
OH
Output HIGH Voltage
V
IN
= V
IH
or V
IL
V
CC
= Mn
I
OH
= –2 mA
2.4
V
I
OH
= –75 mA
V
CC
- 0.2 V
V
V
OL
Output LOWVoltage
V
IN
= V
IH
or V
IL
V
CC
= Mn
I
OL
= 2 mA
0.4
V
I
OL
= 100 mA
0.2
V
V
IH
Input HIGH Voltage
Guaranteed Input Logical HIGH Voltage for all Inputs (Note 1)
2.0
5.5
V
V
IL
Input LOWVoltage
Guaranteed Input Logical LOWVoltage for all Inputs (Note 1)
0.8
V
I
IH
Input HIGH Leakage Current
V
IN
= V
CC
, V
CC
= Max (Note 2)
V
IN
= 0 V V
CC
= Max (Note 2)
10
μA
I
IL
Input LOWLeakage Current
–100
μA
I
OZH
Off-State Output Leakage Current HIGH
V
OUT
= V
CC
, V
CC
= Max, V
IN
= V
IH
or V
IL
(Note 2)
10
μA
I
OZL
Off-State Output Leakage Current LOW
V
OUT
= V
CC
, V
CC
= Max, V
IN
= V
IH
or V
IL
(Note 2)
-100
μA
I
SC
Output Short-Circuit Current
V
OUT
= 0.5 V V
CC
= Max (Note 3)
-50
-130
mA
I
CC
Supply Current
Outputs Open (I
OUT
= 0 mA), V
CC
= Max, f = 15 MHz (Note 4)
55
mA
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