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參數(shù)資料
| 型號： | PALCE610H-25PC |
| 廠商： | LATTICE SEMICONDUCTOR CORP |
| 元件分類： | PLD |
| 英文描述： | USE GAL DEVICES FOR NEW DESIGNS |
| 中文描述： | EE PLD, 25 ns, PDIP24 |
| 封裝： | 0.300 INCH, SKINNY, PLASTIC, DIP-24 |
| 文件頁數(shù)： | 13/14頁 |
| 文件大?。?/td> | 136K |
| 代理商： | PALCE610H-25PC |
2-381
PALCE610H-15/25 (Com’l)
ABSOLUTE MAXIMUM RATINGS
Storage Temperature
–65
°C to +150°C
. . . . . . . . . . .
Ambient Temperature
with Power Applied
–55
°C to +125°C
. . . . . . . . . . . . .
Supply Voltage with
Respect to Ground
–0.5 V to +7.0 V
. . . . . . . . . . . . .
DC Input Voltage
–0.5 V to VCC + 0.5 V
. . . . . . . . . . . .
DC Output or
I/O Pin Voltage
–0.5 V to VCC + 0.5 V
. . . . . . . . . . . .
Static Discharge Voltage
2001 V
. . . . . . . . . . . . . . . .
Latchup Current
(TA = 0
°C to +75°C)
100 mA
. . . . . . . . . . . . . . . . . . . .
Stresses above those listed under Absolute Maximum Rat-
ings may cause permanent device failure. Functionality at or
above these limits is not implied. Exposure to Absolute Maxi-
mum Ratings for extended periods may affect device reliabil-
ity. Programming conditions may differ.
OPERATING RANGES
Commercial (C) Devices
Ambient Temperature (TA)
Operating in Free Air
0
°C to +75°C
. . . . . . . . . . . . . .
Supply Voltage (VCC)
with Respect to Ground
+4.75 V to +5.25 V
. . . . . . . .
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
DC CHARACTERISTICS over COMMERCIAL operating ranges unless otherwise
specified (Note 2)
Parameter
Symbol
Parameter Description
Test Conditions
Min
Max
Unit
VOH
Output HIGH Voltage
VIN = VIH or VIL
IOH = –4.0 mA
2.4
V
VCC = Min
IOH = –2.0 mA
3.84
V
VOL
Output LOW Voltage
VIN = VIH or VIL
IOL = 8.0 mA
0.5
V
VCC = Min
IOL = 4.0 mA
0.45
V
VIH
Input HIGH Voltage
Guaranteed Input Logical HIGH
2.0
V
Voltage for all Inputs (Note 1)
VIL
Input LOW Voltage
Guaranteed Input Logical LOW
0.8
V
Voltage for all Inputs (Note 1)
IIH
Input HIGH Leakage
VIN = 5.25 V, VCC = Max (Note 2)
10
A
Current
IIL
Input LOW Leakage
VIN = 0 V, VCC = Max (Note 2)
–10
A
Current
IOZH
Off-State Output Leakage
VOUT = 5.25 V, VCC = Max
10
A
Current HIGH
VIN = VIH or VIL (Note 2)
IOZL
Off-State Output Leakage
VOUT = 0 V, VCC = Max
–10
A
Current LOW
VIN = VIH or VIL (Note 2)
ISC
Output Short-Circuit
VOUT = 0.5 V, VCC = Max (Note 3)
–30
–150
mA
Current
ICC
Supply Current
VIN = 0 V, Outputs Open (IOUT = 0 mA)
90
mA
VCC = Max
Notes:
1. These are absolute values with respect to device ground and all overshoots due to system and tester noise are included.
2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).
3. Not more than one output should be tested at a time. Duration of the short-circuit should not exceed one second. VOUT = 0.5 V
has been chosen to avoid test problems caused by tester ground degradation.
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