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| 型號(hào)： | OPA621KP |
| 文件頁(yè)數(shù)： | 15/16頁(yè) |
| 文件大?。?/td> | 193K |
| 代理商： | OPA621KP |
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OPA621
15
OPA621
OPA621
2k
R
4
2k
V
OUT
R
3
158
R
5
C
2
15.8k
R
1
R
2
158
V
IN
1000pF
C
1000pF
f
C
BW
Q
= 1MHz
= 20kHz at –3dB
= 50
OPA621
V
OUT
*R
1
2k
+5V
(–)
(+)
D
S
*J
1
D
S
2N5911
–5V
2
3
7
6
4
*R
2
2k
*J
2
FIGURE 12. High-Q 1MHz Bandpass Filter
Feedback from pin 6 to the (–)
FET input required for stability.
* Select J
, J
and R
, R
to set
input stage current for optimum
performance.
: 1pA
: 6nV/
√
Hz at 1MHz
: 500MHz
: 500 V/
μ
s
: 18ns to 0.1%
Minimum Stable Gain :
≥
±
2V/V
I
B
e
N
Gain-Bandwidth
Slew Rate
Settling Time
RELIABILITY DATA
Extensive reliability testing has been performed on the
OPA621. Accelerated life testing (2000 hours) at maximum
operating temperature was used to calculate MTTF at an
ambient temperature of 25
°
C. These test results yield MTTF
of: DIP = 5.02E+7 Hours, and SO-8 = 2.94E+7 Hours.
Additional tests such as PCT have also been performed.
Reliability reports are available upon request for each of the
package options offered.
ENVIRONMENTAL (Q) SCREENING
The inherent reliability of a semiconductor device is
controlled by the design, materials and fabrication of the
device—it cannot be improved by testing. However, the use
of environmental screening can eliminate the majority of
those units which would fail early in their lifetimes (infant
mortality) through the application of carefully selected
accelerated stress levels. Burr-Brown “Q-Screening” pro-
vides environmental screening to our standard industrial
products, thus enhancing reliability. The screening illus-
trated in the following table is performed to selected levels
similar to those of MIL-STD-883.
FIGURE 13. Low Noise, Wideband FET Input Op Amp.
SCREEN
METHOD
Internal Visual
Burr-Brown QC4118
Stabilization Bake
Temperature = 125
°
C, 24 hrs
Temperature Cycling
Temperature = –55
°
C to 125
°
C, 10 cycles
Burn-In Test
Temperature = 125
°
C, 160 hrs minimum
Hermetic Seal
Fine: He leak rate < 1
X
10 atm cc/s
Gross: per Fluorocarbon bubble test
Electrical Tests
As described in specifications tables.
External Visual
Burr-Brown QC5150
NOTE: Q-Screening is available on SG package only.
DEMONSTRATION BOARDS
Demonstration boards are available to speed protyping. The
8-pin DIP packaged parts may be evaluated using the DEM-
OPA65XP board while the SO-8 packaged part may be
evaluated using the DEM-OPA65XU board. Both of these
boards come partially assembled from your local distributor
(the external resistors or the amplifier is not included).
APPLICATIONS
FIGURE 14. Differential Input Buffer Amplifier (G = –2V/V).
FIGURE 11. Unity Gain Difference Amplifier.
OPA621
499
OPA621
249
R
F
249
R
G
249
R
F
249
OPA621
249
249
OPA621
249
249
Single-
Ended
Output
249
249
Differential
Input
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