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參數資料
| 型號： | NLAST9431MTR2G |
| 廠商： | ON SEMICONDUCTOR |
| 元件分類： | 多路復用及模擬開關 |
| 英文描述： | Low Voltage Single Supply Dual DPDT Analog Switch |
| 中文描述： | DUAL 2-CHANNEL, DBL POLE DBL THROW SWITCH, QCC16 |
| 封裝： | LEAD FREE, WQFN-16 |
| 文件頁數： | 3/11頁 |
| 文件大?。?/td> | 107K |
| 代理商： | NLAST9431MTR2G |
NLAST9431
http://onsemi.com
3
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
V
CC
Positive DC Supply Voltage
0.5 to
7.0
V
V
IS
Analog Input Voltage (V
NO
or V
COM
)
0.5
≤
V
IS
≤
V
CC
0.5
V
V
IN
Digital Select Input Voltage
0.5
≤
V
I
≤
7.0
V
I
IK
DC Current, Into or Out of Any Pin
50
mA
P
D
Power Dissipation in Still Air
QFN16
TSSOP16
800
450
mW
T
STG
Storage Temperature Range
65 to
150
°
C
T
L
Lead Temperature, 1 mm from Case for 10 Seconds
260
°
C
T
J
Junction Temperature Under Bias
+150
°
C
MSL
Moisture Sensitivity
Level 1
F
R
Flammability Rating
Oxygen Index: 30% 35%
UL94VO (0.125 in)
I
LATCHUP
LatchUp Performance
Above V
CC
and Below GND at 125
°
C (Note 1)
300
mA
JA
Thermal Resistance
QFN16
TSSOP16
80
164
°
C/W
Absolute maximum continuous ratings are those values beyond which damage to the device may occur. Extended exposure to these conditions
or conditions beyond those indicated may adversely affect device reliability. Functional operation under absolutemaximumrated conditions is
not implied. Functional operation should be restricted to the Recommended Operating Conditions.
1. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Unit
V
CC
DC Supply Voltage
2.0
5.5
V
V
IN
Digital Select Input Voltage
GND
5.5
V
V
IS
Analog Input Voltage (NC, NO, COM)
GND
V
CC
V
T
A
Operating Temperature Range
55
125
°
C
t
r
, t
f
Input Rise or Fall Time, SELECT
V
CC
= 3.3 V
V
CC
= 5.0 V
0.3 V
0.5 V
0
0
100
20
ns/V
DEVICE JUNCTION TEMPERATURE VERSUS
TIME TO 0.1% BOND FAILURES
Junction
Temperature
°
C
Time, Hours
Time, Years
80
1,032,200
117.8
90
419,300
47.9
100
178,700
20.4
110
79,600
9.4
120
37,000
4.2
130
17,800
2.0
140
8,900
1.0
1
1
10
100
1000
FAILURE RATE OF PLASTIC = CERAMIC
UNTIL INTERMETALLICS OCCUR
Figure 3. Failure Rate vs. Time Junction Temperature
N
TIME, YEARS
T
J
°
C
T
J
°
C
T
J
°
C
T
J
°
C
T
J
°
C
T
J
°
C
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