參數(shù)資料
型號： NCV7356D1G
廠商： ON Semiconductor
文件頁數(shù)： 23/24頁
文件大小： 0K
描述： IC TXRX CAN SGL WIRE 8-SOIC
標準包裝： 98
類型： 收發(fā)器
驅(qū)動器/接收器數(shù)： 1/1
規(guī)程： CAN
電源電壓： 5 V ~ 27 V
安裝類型： 表面貼裝
封裝/外殼： 8-SOIC（0.154"，3.90mm 寬）
供應(yīng)商設(shè)備封裝： 8-SOICN
包裝： 管件
其它名稱： NCV7356D1G-ND
NCV7356D1GOS
NCV7356
http://onsemi.com
8
TIMING MEASUREMENT LOAD CONDITIONS
Normal and High Voltage WakeUp Mode
HighSpeed Mode
min load / min tau
3.3 kW / 540 pF
Additional 140 W tool resistance
to ground in parallel
min load / max tau
3.3 kW / 1.2 nF
max load / min tau
200 W / 5.0 nF
Additional 120 W tool resistance
to ground in parallel
max load / max tau
200 W / 20 nF
ELECTRICAL CHARACTERISTICS (5.0 V ≤ VBAT ≤ 27 V, 40°C ≤ TA ≤ 125°C, unless otherwise specified.)
AC CHARACTERISTICS (See Figures 3, 4, and 5)
Characteristic
Symbol
Condition
Min
Typ
Max
Unit
Transmit Delay in Normal and WakeUp Mode,
Bus Rising Edge (Notes 12, 13)
tTr
Min and Max Loads per Timing
Measurement Load Conditions
2.0
6.3
ms
Transmit Delay in WakeUp Mode to VihWU,
Bus Rising Edge (Notes 12, 14)
tTWUr
Min and Max Loads per Timing
Measurement Load Conditions
2.0
18
ms
Transmit Delay in Normal Mode,
Bus Falling Edge (Notes 15, 16)
tTf
Min and Max Loads per Timing
Measurement Load Conditions
1.8
10
ms
Transmit Delay in WakeUp Mode,
Bus Falling Edge (Notes 15, 16)
tTWU1f
Min and Max Loads per Timing
Measurement Load Conditions
3.0
13.7
ms
Transmit Delay in HighSpeed Mode,
Bus Rising Edge (Notes 12, 17)
tTHSr
Min and Max Loads per Timing
Measurement Load Conditions
0.1
1.5
ms
Transmit Delay in HighSpeed Mode,
Bus Falling Edge (Notes 16, 18)
tTHSf
Min and Max Loads per Timing
Measurement Load Conditions
0.04
3.0
ms
Receive Delay, All Active Modes (Note 19)
tDR
CANH High to Low Transition
0.3
1.0
ms
Receive Delay, All Active Modes (Note 19)
tRD
CANH Low to High Transition
0.3
1.0
ms
Input Minimum Pulse Length,
All Active Modes (Note 17)
tmpDR
tmpRD
CANH High to Low Transition
CANH Low to High Transition
0.1
1.0
ms
WakeUp Filter Time Delay
tWUF
See Figure 4
10
70
ms
Receive Blanking Time, After
TxD LH Transition
trb
See Figure 5
0.5
6.0
ms
TxD Timeout Reaction Time
ttout
Normal and HighSpeed Mode
17
ms
TxD Timeout Reaction Time
ttoutwu
WakeUp Mode
17
ms
Delay from Normal to HighSpeed and
High Voltage WakeUp Mode
tdnhs
30
ms
Delay from HighSpeed and High Voltage
WakeUp to Normal Mode
tdhsn
30
ms
Delay from Normal to Standby Mode
tdsby
VBAT = 6.0 V to 27 V
500
ms
Delay from Sleep to Normal Mode
tdsnwu
VBAT = 6.0 V to 27 V
50
ms
Delay from Sleep to High Voltage Mode
tdshv
VBAT = 6.0 V to 27 V
50
ms
Delay from Standby to Sleep Mode (Note 20)
tdsleep
VBAT = 6.0 V to 27 V
100
250
500
ms
12.Minimum signal delay time is measured from the TxD voltage threshold to CANH = 1.0 V. t load should be min per the Timing Measurement
Load Conditions table.
13.Maximum signal delay time is measured from the TxD voltage threshold to CANH = 3.5 V at VBAT = 27 V, CANH = 2.8 V at VBAT = 5.0 V. t load
should be max per the Timing Measurement Load Conditions table.
14.Maximum signal delay time is measured from the TxD voltage threshold to CANH = 9.2 V. Vihwumax = Vihwufix,
max + Vgoff = 7.9 V + 1.3 V = 9.2 V. t load should be max per the Timing Measurement Load Conditions table.
15.Minimum signal delay time is measured from the TxD voltage threshold to CANH = 3.5 V at VBAT = 27 V, CANH = 2.8 V at VBAT = 5.0 V. t load
should be min per the Timing Measurement Load Conditions table.
16.Maximum signal delay time is measured from the TxD voltage threshold to CANH = 1 V. t load should be max per the Timing Measurement
Load Conditions table.
17.Maximum signal delay time is measured from the TxD voltage threshold to CANH = 3.5 V. t load should be max per the Timing Measurement
Load Conditions table.
18.Minimum signal delay time is measured from the TxD voltage threshold to CANH = 3.5 V. t load should be min per the Timing Measurement
Load Conditions table.
19.Receive delay time is measured from the rising / falling edge crossing of the nominal Vih value on CANH to the falling (Vcmos_il_max) / rising
(Vcmos_ih_min) edge of RxD. This parameter is tested by applying a square wave signal to CANH. The minimum slew rate for the bus rising
and falling edges is 50 V/ms. The low level on bus is always 0 V. For normal mode and highspeed mode testing the high level on bus is 4 V.
For HVWU mode testing the high level on bus is VBAT 2 V. Relaxation of this noncritical parameter from 0.15 ms to 0.10 ms may be addressed
in future revisions of GMW3089.
20.Tested on 14 Pin package only.
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