參數(shù)資料
型號: NCV2574
廠商: ON SEMICONDUCTOR
英文描述: 0.5 A, Adjustable Output Voltage, Step-Down Switching Regulator(0.5A,可調(diào)輸出電壓,降壓型開關穩(wěn)壓器)
中文描述: 0.5甲,可調(diào)輸出電壓,降壓型開關穩(wěn)壓器(0.5A的,可調(diào)輸出電壓,降壓型開關穩(wěn)壓器)
文件頁數(shù): 2/26頁
文件大小: 295K
代理商: NCV2574
LM2574, NCV2574
http://onsemi.com
2
Figure 1. Block Diagram and Typical Application
7.0 40 V
Unregulated
DC Input
L1
330 H
Pwr
Gnd
+V
in
5
C
in
22 F
4
ON/OFF
3
Output
7
Feedback
1
D1
1N5819
C
out
220 F
Typical Application
(Fixed Output Voltage Versions)
Representative Block Diagram and Typical Application
Unregulated
DC Input
+V
in
5
C
out
Feedback
1
C
in
L1
D1
R2
R1
1.0 k
Output
7
Pwr Gnd
4
ON/OFF
3
(5)
Reset
Latch
Thermal
Shutdown
52 kHz
Oscillator
1.235 V
BandGap
Reference
Freq
Shift
18 kHz
Comparator
Fixed Gain
Error Amplifier
Current
Limit
Driver
1.0 Amp
Switch
ON/OFF
3.1 V Internal
Regulator
V
out
Load
Output
Voltage Versions
3.3 V
5.0 V
12 V
15 V
R2
( )
1.7 k
3.1 k
8.84 k
11.3 k
For adjustable version
R1 = open, R2 = 0
LM2574
5.0 V Regulated
Output 0.5 A Load
Sig
Gnd
2
Sig Gnd
2
(12)
(14)
(3)
(4)
(6)
(5)
(12)
(3)
(4)
(14)
(6)
NOTE: Pin numbers in ( ) are for the SO16W package.
ABSOLUTE MAXIMUM RATINGS
(Absolute Maximum Ratings indicate limits beyond which damage to the device may occur).
Rating
Symbol
Value
Unit
Maximum Supply Voltage
V
in
45
V
ON/OFF Pin Input Voltage
0.3 V
V
+V
in
V
Output Voltage to Ground (Steady State)
1.0
V
DW Suffix, Plastic Package Case 751G
Max Power Dissipation
Thermal Resistance, JunctiontoAir
P
D
R
JA
Internally Limited
145
W
°
C/W
N Suffix, Plastic Package Case 626
Max Power Dissipation
Thermal Resistance, JunctiontoAmbient
Thermal Resistance, JunctiontoCase
P
D
R
JA
R
JC
Internally Limited
100
5.0
W
°
C/W
°
C/W
Storage Temperature Range
T
stg
65
°
C to +150
°
C
°
C
Minimum ESD Rating
(Human Body Model: C = 100 pF, R = 1.5 k )
2.0
kV
Lead Temperature (Soldering, 10 seconds)
260
°
C
Maximum Junction Temperature
T
J
150
°
C
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
NOTE: ESD data available upon request.
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