A. All input pulses are supplied by a generator having the following characteristics: t" />
參數(shù)資料
型號(hào): NB3N206SDG
廠商: ON Semiconductor
文件頁數(shù): 18/19頁
文件大?。?/td> 0K
描述: IC CLK DVR RECEIVER M-LVDS 8SOIC
標(biāo)準(zhǔn)包裝: 98
類型: 緩沖器/驅(qū)動(dòng)器
電路數(shù): 1
比率 - 輸入:輸出: 1:1
差分 - 輸入:輸出: 是/是
輸入: LVCMOS,LVDS
輸出: LVCMOS,LVDS
頻率 - 最大: 200MHz
電源電壓: 3 V ~ 3.6 V
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 8-SOIC(0.154",3.90mm 寬)
供應(yīng)商設(shè)備封裝: 8-SOIC
包裝: 管件
NB3N201S, NB3N206S
http://onsemi.com
8
A. All input pulses are supplied by a generator having the following characteristics: tr or tf≤ 1 ns, pulse frequency = 500 kHz,
duty cycle = 50 ± 5%.
B. C1, C2 and C3 include instrumentation and fixture capacitance within 2 cm of the D.U.T. and are 20% tolerance.
C. R1 and R2 are metal film, surface mount, 1% tolerance, and located within 2 cm of the D.U.T.
D. The measurement of VOS(PP) is made on test equipment with a –3 dB bandwidth of at least 1 GHz.
Figure 5. Test Circuit and Definitions for the Driver CommonMode Output Voltage
Figure 6. Driver ShortCircuit Test Circuit
A. All input pulses are supplied by a generator having the following characteristics: tr or tf≤ 1 ns, frequency = 500 kHz,
duty cycle = 50 ±5%.
B. C1, C2, and C3 include instrumentation and fixture capacitance within 2 cm of the D.U.T. and are 20%.
C. R1 is a metal film, surface mount, and 1% tolerance and located within 2 cm of the D.U.T.
D. The measurement is made on test equipment with a 3 dB bandwidth of at least 1 GHz.
Figure 7. Driver Test Circuit, Timing, and Voltage Definitions for the Differential Output Signal
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