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參數(shù)資料
| 型號： | MT4C1M16E5DJ-6 |
| 廠商： | Micron Technology, Inc. |
| 英文描述： | EDO DRAM |
| 中文描述： | EDO公司的DRAM |
| 文件頁數(shù)： | 6/24頁 |
| 文件大?。?/td> | 385K |
| 代理商： | MT4C1M16E5DJ-6 |
6
1 Meg x 16 EDO DRAM
D52_B.p65 – Rev. B; Pub. 3/01
Micron Technology, Inc., reserves the right to change products or specifications without notice.
2001, Micron Technology, Inc
16Mb: 1 MEG x16
EDO DRAM
DC ELECTRICAL CHARACTERISTICS AND OPERATING CONDITIONS
(Notes: 1; notes appear on pages 10-11)
3.3V
5V
PA RA METER/CONDITION
SUPPLY VOLTAGE
INPUT HIGH VOLTAGE:
Valid Logic 1; All inputs, I/Os and any NC
INPUT LOW VOLTAGE:
Valid Logic 0; All inputs, I/Os and any NC
INPUT LEAKAGE CURRENT:
Any input at V
IN
(0V
￡
V
IN
￡
V
IH
[MAX]);
All other pins not under test = 0V
OUTPUT HIGH VOLTAGE:
I
OUT
= -2mA(3.3V), -5mA(5V)
OUTPUT LOW VOLTAGE:
I
OUT
= 2mA(3.3V), 4.2mA(5V)
OUTPUT LEAKAGE CURRENT:
Any output at V
OUT
(0V
￡
V
OUT
￡
5.5V);
DQ is disabled and in High-Z state
SY MBOL
V
CC
MIN
3.0
MA X
3.6
MIN
4.5
MA X
5.5
UNITS NOTES
V
V
IH
2.0
5.5
2.4
V
CC
+ 1
V
V
IL
-1.0
0.8
-0.5
0.8
V
I
I
-2
2
-2
2
μA
4
V
OH
2.4
–
2.4
–
V
V
OL
–
0.4
–
0.4
V
I
OZ
-5
5
-5
5
μA
ABSOLUTE MAXIMUM RATINGS*
Voltage on V
CC
Pin Relative to V
SS
3.3V ......................................................... -1V to +4.6V
5V ............................................................... -1V to +7V
Voltage on NC, Inputs or I/O Pins Relative to Vss:
3.3V ......................................................... -1V to +5.5V
5V ............................................................... -1V to +7V
Operating Temperature
T
A
(commercial) .................................. 0oC to +70oC
T
A
(extended) ...................................-20oC to +80oC
Storage Temperature (plastic) ........... -55oC to +150oC
Power Dissipation ........................................................ 1W
Short Circuit Output Current................................ 50mA
*Stresses greater than those listed under “Absolute
Maximum Ratings” may cause permanent damage to
the device. This is a stress rating only, and functional
operation of the device at these or any other conditions
above those indicated in the operational sections of
this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may
affect reliability.
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|---|---|
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