參數(shù)資料
型號: MPC9893AE
廠商: IDT, Integrated Device Technology Inc
文件頁數(shù): 3/14頁
文件大小: 0K
描述: IC PLL CLK GEN 1:12 3.3V 48-LQFP
標(biāo)準(zhǔn)包裝: 250
類型: PLL 時(shí)鐘發(fā)生器
PLL: 帶旁路
輸入: LVCMOS
輸出: LVCMOS
電路數(shù): 1
比率 - 輸入:輸出: 2:12
差分 - 輸入:輸出: 無/無
頻率 - 最大: 200MHz
除法器/乘法器: 是/是
電源電壓: 2.375 V ~ 3.465 V
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 48-LQFP
供應(yīng)商設(shè)備封裝: 48-TQFP(7x7)
包裝: 托盤
MPC9893 REVISION 8 JANUARY 16, 2013
11
2013 Integrated Device Technology, Inc.
MPC9893 Data Sheet
3.3V 1:12 LVCMOS PLL CLOCK GENERATOR
Figure 13. Propagation Delay (t(), static phase
offset) Test Reference
Figure 14. Output Duty Cycle (DC)
Figure 12. Output-to-Output Skew tSK(O)
The pin-to-pin skew is defined as the worst case difference in propagation delay
between any similar delay path within a single device
VCC
VCC 2
GND
VCC
VCC 2
GND
tSK(O)
VCC
VCC 2
GND
VCC
VCC 2
GND
t()
CLK0,
CLK1
FB
The time from the PLL controlled edge to the noncontrolled edge, divided by
the time between PLL controlled edges, expressed as a percentage
VCC
VCC 2
GND
tP
T0
DC = tP/T0 x 100%
Figure 16. Cycle-to-Cycle Jitter
Figure 15. I/O Jitter
Figure 18. Output Transition Time Test Reference
tF
tR
VCC=3.3 V
2.4
0.55
TJIT() = |T0–T1mean|
CCLK0, 1
FB
The deviation in t0 for a controlled edge with respect to a t0 mean in a random sample
of cycles
The variation in cycle time of a signal between adjacent cycles, over a random sample
of adjacent cycle pairs
TN
TJIT(CC) = |TN–TN+1|
TN+1
The deviation in cycle time of a signal with respect to the ideal period over a random
sample of cycles
TJIT(PER) = |TN–1/f0|
T0
Figure 17. Period Jitter
VCC=2.5 V
1.8
0.6
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