參數(shù)資料
型號(hào)： MPC5603PEFMLQ
廠商： FREESCALE SEMICONDUCTOR INC
元件分類： 微控制器/微處理器
英文描述： 32-BIT, FLASH, 64 MHz, MICROCONTROLLER, PQFP144
封裝： 20 X 20 MM, 1.40 MM HEIGHT, 0.50 MM PITCH, LQFP-144
文件頁數(shù)： 26/84頁
文件大小： 1663K
代理商： MPC5603PEFMLQ
MPC5604P Microcontroller Data Sheet, Rev. 5
Preliminary—Subject to Change Without Notice
Freescale Semiconductor
32
3.4
Electromagnetic interference (EMI) characteristics
3.5
Electrostatic discharge (ESD) characteristics
Table 10. EMI Testing Specifications1
1 EMI testing and I/O port waveforms per SAE J1752/3 issued 1995-03.
Symbol
Parameter
Conditions
fOSC/fBUS
Frequency
Level
(Max)
Unit
Radiated
emissions,
electric field
VRE_TEM
VDD =5.5 V;
TA =+25 °C
150 kHz–30 MHz
RBW 9 kHz, Step
Size 5 kHz
30 MHz–1 GHz
RBW 120 kHz, Step
Size 80 kHz
16 MHz crystal
40 MHz bus
No PLL frequency
modulation
150 kHz–50 MHz
20
dB
μV
50–150 MHz
20
150–500 MHz
26
500–1000 MHz
26
IEC Level
K
—
SAE Level
3
—
16 MHz crystal
40 MHz bus
±2% PLL
frequency
modulation
150 kHz–50 MHz
18
dB
μV
50–150 MHz
18
15–500 MHz
15
500–1000 MHz
15
IEC Level
M
—
SAE Level
2
—
Table 11. ESD ratings1,2
1 All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated
Circuits.
2 A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification requirements. Complete DC parametric and functional testing shall be performed per applicable
device specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification
Symbol
Parameter
Conditions
Value
Unit
VESD(HBM)
SR Electrostatic discharge (Human Body Model)
—
2000
V
VESD(CDM)
SR Electrostatic discharge (Charged Device Model)
—
750 (corners)
V
500 (other)
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