參數(shù)資料
型號(hào): MK30N512VLQ100R
廠商: FREESCALE SEMICONDUCTOR INC
元件分類: 微控制器/微處理器
英文描述: 32-BIT, FLASH, 100 MHz, RISC MICROCONTROLLER, PQFP144
封裝: 20 X 20 MM, LQFP-144
文件頁數(shù): 27/72頁
文件大小: 1847K
代理商: MK30N512VLQ100R
6.4.1.5 Write endurance to FlexRAM for EEPROM
When the FlexNVM partition code is not set to full data flash, the EEPROM data set size
can be set to any of several non-zero values.
The bytes not assigned to data flash via the FlexNVM partition code are used by the
FTFL to obtain an effective endurance increase for the EEPROM data. The built-in
EEPROM record management system raises the number of program/erase cycles that can
be attained prior to device wear-out by cycling the EEPROM data through a larger
EEPROM NVM storage space.
While different partitions of the FlexNVM are available, the intention is that a single
choice for the FlexNVM partition code and EEPROM data set size is used throughout the
entire lifetime of a given application. The EEPROM endurance equation and graph
shown below assume that only one configuration is ever used.
Writes_subsystem =
× Write_efficiency × n
EEPROM – 2 × EEESPLIT × EEESIZE
EEESPLIT × EEESIZE
nvmcycd
where
Writes_subsystem — minimum number of writes to each FlexRAM location for
subsystem (each subsystem can have different endurance)
EEPROM — allocated FlexNVM for each EEPROM subsystem based on DEPART;
entered with Program Partition command
EEESPLIT — FlexRAM split factor for subsystem; entered with the Program
Partition command
EEESIZE — allocated FlexRAM based on DEPART; entered with Program Partition
command
Write_efficiency —
0.25 for 8-bit writes to FlexRAM
0.50 for 16-bit or 32-bit writes to FlexRAM
nnvmcycd — data flash cycling endurance
Peripheral operating requirements and behaviors
K30 Sub-Family Data Sheet Data Sheet, Rev. 4, 3/2011.
Freescale Semiconductor, Inc.
Preliminary
33
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