參數(shù)資料
型號: MCIMX27VJP4AR2
廠商: Freescale Semiconductor
文件頁數(shù): 75/152頁
文件大小: 0K
描述: IC MPU IMX27 404TMAP
標準包裝: 1,000
系列: i.MX27
核心處理器: ARM9
芯體尺寸: 32-位
速度: 400MHz
連通性: 1 線,CAN,EBI/EMI,以太網(wǎng),I²C,MMC,智能卡,SPI,SSI,UART/USART,USB OTG
外圍設備: DMA,LCD,POR,PWM,WDT
程序存儲器類型: ROMless
RAM 容量: 45K x 8
電壓 - 電源 (Vcc/Vdd): 1.38 V ~ 1.52 V
振蕩器型: 外部
工作溫度: -20°C ~ 85°C
封裝/外殼: 404-LFBGA
包裝: 帶卷 (TR)
i.MX27 and i.MX27L Data Sheet, Rev. 1.8
Freescale Semiconductor
29
Signal Descriptions
Power_on_reset
(Note: in the RTC power domain)
osc32K_bypass
The signal for osc32k input bypass (Note: in the RTC power domain)
Bootstrap
BOOT [3:0]
System Boot Mode Select—The operational system boot mode of the i.MX27/MX27L processor
upon system reset is determined by the settings of these pins. BOOT[1:0] are also used as
handshake signals to PMIC(VSTBY).
JTAG
JTAG_CTRL
JTAG Controller select signal—JTAG_CTRL is sampled during rising edge of TRST. Must be
pulled to logic high for proper JTAG interface to debugger. Pulling JTAG_CRTL low is for internal
test purposes only.
TRST
Test Reset Pin—External active low signal used to asynchronously initialize the JTAG controller.
TDO
Serial Output for test instructions and data. Changes on the falling edge of TCK.
TDI
Serial Input for test instructions and data. Sampled on the rising edge of TCK.
TCK
Test Clock to synchronize test logic and control register access through the JTAG port.
TMS
Test Mode Select to sequence JTAG test controller’s state machine. Sampled on rising edge of
TCK.
RTCK
JTAG Return Clock used to enhance stability of JTAG debug interface devices. This signal is
multiplexed with 1-Wire; thus, utilizing 1-Wire will render RTCK unusable and vice versa; PE16.
Secure Digital Interface (X2)
SD1_CMD
SD Command bidirectional signal—If the system designer does not want to make use of the
internal pull-up, via the Pull-up enable register, a 4. 7K–69 K external pull up resistor must be
added. This signal is multiplexed with CSPI3_MOSI; PE22.
SD1_CLK
SD Output Clock. This signal is multiplexed with CSPI3_SCLK; PE23.
SD1_D[3:0]
SD Data bidirectional signals—If the system designer does not want to make use of the internal
pull-up, via the Pull-up enable register, a 50 K–69 K external pull up resistor must be added.
SD1_D[3] is muxed with CSPI3_SS while SD1_D[0] is muxed with CSPI3_MISO PE21–18.
SD2_CMD
SD Command bidirectional signal. This signal is multiplexed with MSHC_BS; through GPIO
multiplexed with SLCDC1_CS; PB8.
SD2_CLK
SD Output Clock signal. This signal is multiplexed with MSHC_SCLK, through GPIO
multiplexed with SLCDC1_CLK; PB9.
SD2_D[3:0]
SD Data bidirectional signals. SD2_D[3:0] multiplexed with MSHC_DATA[0:3], also through
GPIO SD2_1:0] multiplexed with SLCDC1_RS and SLDCD1_D0; PB7–PB4.
SD3_CMD
SD Command bidirectional signal. This signal is through GPIO PD0 multiplexed with
FEC_TXD0.
SD3_CLK
SD Output Clock signal. This signal is multiplexed with ETMTRACEPKT15 and also through
GPIO PD1 multiplexed with FEC_TXD1.
Table 3. i.MX27/MX27L Signal Descriptions (continued)
Pad Name
Function/Notes
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