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參數資料
| 型號： | MCF52252AF80 |
| 廠商： | FREESCALE SEMICONDUCTOR INC |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | 32-BIT, FLASH, 80 MHz, RISC MICROCONTROLLER, PQFP100 |
| 封裝： | 14 X 14 MM, ROHS COMPLIANT, LQFP-100 |
| 文件頁數： | 20/46頁 |
| 文件大小： | 560K |
| 代理商： | MCF52252AF80 |
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MCF52259 ColdFire Microcontroller, Rev. 4
Electrical Characteristics
Freescale Semiconductor
27
100 LQFP
Junction to ambient, natural convection
Single layer board (1s)
JA
5313,14
C/W
Junction to ambient, natural convection
Four layer board (2s2p)
JA
391,15
C/W
Junction to ambient, (@200 ft/min)
Single layer board (1s)
JMA
421,3
C/W
Junction to ambient, (@200 ft/min)
Four layer board (2s2p)
JMA
331,3
C/W
Junction to board
—
JB
2516
C/W
Junction to case
—
JC
917
C/W
Junction to top of package
Natural convection
jt
218
C/W
Maximum operating junction temperature
—
Tj
105
oC
1
JA and jt parameters are simulated in conformance with EIA/JESD Standard 51-2 for natural convection. Freescale
recommends the use of
JA and power dissipation specifications in the system design to prevent device junction
temperatures from exceeding the rated specification. System designers should be aware that device junction temperatures
can be significantly influenced by board layout and surrounding devices. Conformance to the device junction temperature
specification can be verified by physical measurement in the customer’s system using the
jt parameter, the device power
dissipation, and the method described in EIA/JESD Standard 51-2.
2 Per JEDEC JESD51-2 with the single-layer board (JESD51-3) horizontal.
3 Per JEDEC JESD51-6 with the board JESD51-7) horizontal.
4 Thermal resistance between the die and the printed circuit board in conformance with JEDEC JESD51-8. Board
temperature is measured on the top surface of the board near the package.
5 Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883
Method 1012.1).
6 Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written
in conformance with Psi-JT.
7
JA and jt parameters are simulated in conformance with EIA/JESD Standard 51-2 for natural convection. Freescale
recommends the use of
JA and power dissipation specifications in the system design to prevent device junction
temperatures from exceeding the rated specification. System designers should be aware that device junction temperatures
can be significantly influenced by board layout and surrounding devices. Conformance to the device junction temperature
specification can be verified by physical measurement in the customer’s system using the
jt parameter, the device power
dissipation, and the method described in EIA/JESD Standard 51-2.
8 Per JEDEC JESD51-2 with the single-layer board (JESD51-3) horizontal.
9 Per JEDEC JESD51-6 with the board JESD51-7) horizontal.
10 Thermal resistance between the die and the printed circuit board in conformance with JEDEC JESD51-8. Board
temperature is measured on the top surface of the board near the package.
11 Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883
Method 1012.1).
12 Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2. When Greek letters are not available, the thermal characterization parameter is written
in conformance with Psi-JT.
13
JA and jt parameters are simulated in conformance with EIA/JESD Standard 51-2 for natural convection. Freescale
recommends the use of
JA and power dissipation specifications in the system design to prevent device junction
temperatures from exceeding the rated specification. System designers should be aware that device junction temperatures
can be significantly influenced by board layout and surrounding devices. Conformance to the device junction temperature
specification can be verified by physical measurement in the customer’s system using the
jt parameter, the device power
dissipation, and the method described in EIA/JESD Standard 51-2.
14 Per JEDEC JESD51-2 with the single-layer board (JESD51-3) horizontal.
15 Per JEDEC JESD51-6 with the board JESD51-7) horizontal.
Table 8. Thermal Characteristics (continued)
Characteristic
Symbol
Value
Unit
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|---|---|
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| MCF5235CVM150 | 32-BIT, 150 MHz, RISC PROCESSOR, PBGA256 |
| MCF5232CAB80 | 32-BIT, 80 MHz, RISC PROCESSOR, PQFP160 |
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相關代理商/技術參數 |
參數描述 |
|---|---|
| MCF52252AF80 | 制造商:Freescale Semiconductor 功能描述:32-bit Microcontroller IC |
| MCF52252CAF66 | 功能描述:32位微控制器 - MCU KIRIN3 COLDFIRE V2 RoHS:否 制造商:Texas Instruments 核心:C28x 處理器系列:TMS320F28x 數據總線寬度:32 bit 最大時鐘頻率:90 MHz 程序存儲器大小:64 KB 數據 RAM 大小:26 KB 片上 ADC:Yes 工作電源電壓:2.97 V to 3.63 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:LQFP-80 安裝風格:SMD/SMT |
| MCF52252CAF66 | 制造商:Freescale Semiconductor 功能描述:IC 32BIT MCU COLDFIRE/68K 66MHZ LQFP-100 |
| MCF52254AF80 | 功能描述:32位微控制器 - MCU KIRIN3 COLDFIRE V2 RoHS:否 制造商:Texas Instruments 核心:C28x 處理器系列:TMS320F28x 數據總線寬度:32 bit 最大時鐘頻率:90 MHz 程序存儲器大小:64 KB 數據 RAM 大小:26 KB 片上 ADC:Yes 工作電源電壓:2.97 V to 3.63 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:LQFP-80 安裝風格:SMD/SMT |
| MCF52254AF80 | 制造商:Freescale Semiconductor 功能描述:IC 32BIT MCU COLDFIRE/68K 80MHZ LQFP-100 |
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