參數(shù)資料
型號(hào): MC9S08GW64CLH
廠商: Freescale Semiconductor
文件頁(yè)數(shù): 2/42頁(yè)
文件大小: 0K
描述: IC MCU 8BIT 64KB FLASH 64 LQFP
標(biāo)準(zhǔn)包裝: 800
系列: S08
核心處理器: S08
芯體尺寸: 8-位
速度: 20MHz
連通性: I²C,LIN,SCI,SPI
外圍設(shè)備: LCD,PWM,WDT
輸入/輸出數(shù): 57
程序存儲(chǔ)器容量: 64KB(64K x 8)
程序存儲(chǔ)器類型: 閃存
RAM 容量: 4K x 8
電壓 - 電源 (Vcc/Vdd): 1.8 V ~ 3.6 V
數(shù)據(jù)轉(zhuǎn)換器: A/D 16x16b
振蕩器型: 內(nèi)部
工作溫度: -40°C ~ 85°C
封裝/外殼: 64-LQFP
包裝: 托盤
MC9S08GW64 Series MCU Data Sheet, Rev. 3
Electrical Characteristics
Freescale Semiconductor
10
3
Electrical Characteristics
3.1
Introduction
This section contains electrical and timing specifications for the MC9S08GW64 sries of microcontrollers available at the time
of publication.
3.2
Parameter Classification
The electrical parameters shown in this supplement are guaranteed by various methods. To give the customer a better
understanding the following classification is used and the parameters are tagged accordingly in the tables where appropriate:
NOTE
The classification is shown in the column labeled “C” in the parameter tables where
appropriate.
3.3
Absolute Maximum Ratings
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not guaranteed. Stress beyond the
limits specified in Table 4 may affect device reliability or cause permanent damage to the device. For functional operating
conditions, refer to the remaining tables in this section.
This device contains circuitry protecting against damage due to high static voltage or electrical fields; however, it is advised
that normal precautions be taken to avoid application of any voltages higher than maximum-rated voltages to this
77
61
VLL2
78
62
VLL1
79
63
VCAP2
80
64
VCAP1
1 TAMPER0 pin is dedicatedly used for Battery Removal Tamper and not exposed on any SoC pins.
2 PTA5 is with double drive strength.
3 PTA6 is an output-only pin when it is configured as GPIO.
4 PTB2, PTB3 and PTB4 are compatible with 5 V devices with a pullup device.
Table 3. Parameter Classifications
P
Those parameters are guaranteed during production testing on each individual device.
C
Those parameters are achieved by the design characterization by measuring a statistically relevant
sample size across process variations.
T
Those parameters are achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted. All values shown in the typical column are within this
category.
D
Those parameters are derived mainly from simulations.
Table 2. Pin Availability by Package Pin-Count (continued)
80
64
Port Pin
Default func
Alt 1
Alt 2
Alt3
Alt4
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