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MC68HC908JL3E Family Data Sheet, Rev. 4
160
Freescale Semiconductor
A.5.2 DC Electrical Characteristics
Table A-2. DC Electrical Characteristics
Characteristic(1)
1. VDD = 2.4 Vdc, VSS = 0 Vdc, TA = TL to TH, unless otherwise noted.
Symbol
Min
Typ(2)
2. Typical values reflect average measurements at midpoint of voltage range, 25
°C only.
Max
Unit
Output high voltage (ILOAD = –1.0mA)
PTA0–PTA6, PTB0–PTB7, PTD0–PTD7
VOH
VDD–0.4
——
V
Output low voltage (ILOAD = 0.8mA)
PTA6, PTB0–PTB7, PTD0, PTD1, PTD4, PTD5
VOL
——
0.4
V
Output low voltage (ILOAD = 15mA)
PTD6, PTD7
VOL
——
0.5
V
Input high voltage
PTA0–PTA6, PTB0–PTB7, PTD0–PTD7,
RST, IRQ, OSC1
VIH
0.7
× V
DD
—
VDD
V
Input low voltage
PTA0–PTA6, PTB0–PTB7, PTD0–PTD7,
RST, IRQ, OSC1
VIL
VSS
—
0.2
× V
DD
V
VDD supply current (VDD = 2.4V, fOP = 2MHz)
Run(3)
Wait(4)
Stop(5)
0
°C to 85°C
3. Run (operating) IDD measured using external square wave clock source. All inputs 0.2 V from rail. No dc loads. Less than
100 pF on all outputs. CL = 20 pF on OSC2. All ports configured as inputs. OSC2 capacitance linearly affects run IDD.
Measured with all modules enabled.
4. Wait IDD measured using external square wave clock source; all inputs 0.2 V from rail; no dc loads; less than 100 pF on
all outputs. CL = 20 pF on OSC2; all ports configured as inputs; OSC2 capacitance linearly affects wait IDD.
5. STOP IDD measured with OSC1 grounded, no port pins sourcing current. LVI is disabled.
IDD
—
2
1
3.5
1.5
3
mA
μA
Digital I/O ports Hi-Z leakage current
IIL
——
± 10
μA
Input current
IIN
——
± 1
μA
Capacitance
Ports (as input or output)
COUT
CIN
—
12
8
pF
POR rearm voltage(6)
6. Maximum is highest voltage that POR is guaranteed.
VPOR
0—
100
mV
POR rise time ramp rate(7)
7. If minimum VDD is not reached before the internal POR reset is released, RST must be driven low externally until minimum
VDD is reached.
RPOR
0.02
—
V/ms
Pullup resistors(8)
PTD6, PTD7
RST, IRQ, PTA0–PTA6
8. RPU1 and RPU2 are measured at VDD = 5.0V
RPU1
RPU2
1.8
16
3.3
26
4.8
36
k
Ω
k
Ω