參數(shù)資料
型號(hào): MC145192F
廠商: MOTOROLA INC
元件分類: XO, clock
英文描述: Low-Voltage 1.1 GHz PLL Frequency Synthesizer
中文描述: PLL FREQUENCY SYNTHESIZER, 1100 MHz, PDSO20
封裝: SOG-20
文件頁(yè)數(shù): 6/24頁(yè)
文件大小: 348K
代理商: MC145192F
MC145192
6
MOTOROLA
LOOP SPECIFICATIONS
(VDD = VCC = 2.7 to 5.0 V unless otherwise indicated, TA = – 40
°
to 85
°
C)
Guaranteed
Operating Range
Min
400
200
Symbol
Vin
Parameter
Test Condition
Max
1500
1500
Unit
mV p–p
Input Voltage Range, fin
(Figure 7)
100 MHz
fin < 250 MHz
250 MHz
fin
1100 MHz
Vin
400 mV p–p
fref
Input Frequency, REFin Externally Driven in
Reference Mode (Figure 8)
VDD = 2.7 V
VDD = 3.0 V
VDD = 3.5 V
VDD = 4.5 to 5 V
1
4.5
5.5
12
20
20
20
27
MHz
Vin
1 V p–p
VDD = 2.7 V
VDD = 3.0 V
VDD = 3.5 V
VDD = 4.5 to 5 V
1
1.5
2
4.5
20
20
20
27
MHz
fXTAL
Crystal Frequency, Crystal Mode
(Figure 9)
C1
30 pF, C2
30 pF, Includes Stray
Capacitance
2
10
MHz
fout
f
Output Frequency, REFout (Figures 10 and 12)
Operating Frequency of the Phase Detectors
Output Pulse Width,
φ
R,
φ
V, and LD
(Figures 11 and 12)
CL = 30 pF
dc
5
MHz
dc
1
MHz
tw
fR in Phase with fV, CL = 50 pF,
VPD = 2.7 V, VDD = VCC = 2.7 V
CL = 50 pF, VPD = 2.7 V,
VDD = VCC = 2.7 V
20
140
ns
tTLH,
tTHL
Cin
Output Transition Times, LD,
φ
V, and
φ
R
(Figures 11 and 12)
80
ns
Input Capacitance, REFin
5
pF
SINE WAVE
GENERATOR
1000 pF
DEVICE
UNDER
TEST
1000 pF
Vin
TEST
POINT
V+
VCC
VDD
fin
fin
GND
OUTPUT A
50
*
Figure 7. Test Circuit
(fv)
* Characteristic Impedance
SINE WAVE
GENERATOR
DEVICE
UNDER
TEST
0.01
μ
F
TEST
POINT
VCC
VDD
REFin
GND
OUTPUT A
Vin
Figure 8. Test Circuit–Reference Mode
(fR)
TEST
POINT
REFout
V+
DEVICE
UNDER
TEST
C1
TEST
POINT
VCC
VDD
OUTPUT A
GND
REFin
REFout
C2
Figure 9. Test Circuit–Crystal Mode
(fR)
V+
50%
REFout
1/f REFout
Figure 10. Switching Waveform
10%
90%
OUTPUT
tTLH
tTHL
Figure 11. Switching Waveform
50%
tw
TEST POINT
DEVICE
UNDER
TEST
CL*
* Includes all probe and
fixture capacitance.
Figure 12. Test Circuit
50
*
* Characteristic Impedance
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