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參數(shù)資料
| 型號： | MAX1126 |
| 廠商： | Maxim Integrated Products, Inc. |
| 英文描述： | Quad, 12-Bit, 40Msps, 1.8V ADC with Serial LVDS Outputs |
| 中文描述： | 四路、12位、40Msps、1.8V ADC，串行LVDS輸出 |
| 文件頁數(shù)： | 23/25頁 |
| 文件大小： | 790K |
| 代理商： | MAX1126 |
M
Quad, 12-Bit, 40Msps, 1.8V ADC with
S erial LV DS Outputs
______________________________________________________________________________________
23
Bipolar offset error is the amount of deviation between
the measured midscale transition point and the ideal
midscale transition point.
Gain Error
Gain error is a figure of merit that indicates how well the
slope of the actual transfer function matches the slope
of the ideal transfer function. For the MAX1126, the gain
error is the difference of the measured full-scale and
zero-scale transition points minus the difference of the
ideal full-scale and zero-scale transition points.
For the bipolar devices (MAX1126), the full-scale transi-
tion point is from 0x7FE to 0x7FF for two’s complement
output format (0xFFE to 0xFFF for offset binary) and the
zero-scale transition point is from 0x800 to 0x801 for
two’s complement (0x000 to 0x001 for offset binary).
Crosstalk
Crosstalk indicates how well each analog input is isolat-
ed from the others. For the MAX1126, a 5.3MHz,
-0.5dBFS analog signal is applied to one channel while
a 19.3MHz, -0.5dBFS analog signal is applied to all
other channels. An FFT is taken on the channel with the
5.3MHz analog signal. From this FFT, the crosstalk is
measured as the difference in the 5.3MHz and
19.3MHz amplitudes.
Aperture Delay
Aperture delay (t
AD
) is the time defined between the
rising edge of the sampling clock and the instant when
an actual sample is taken. See Figure 10.
Aperture J itter
Aperture jitter (t
AJ
) is the sample-to-sample variation in
the aperture delay. See Figure 10.
S ignal-to-Noise Ratio (S NR)
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error). The ideal, theoretical
minimum analog-to-digital noise is caused by quantiza-
tion error only and results directly from the ADC’s reso-
lution (N bits):
SNR
dB[max]
= 6.02
dB
x N + 1.76
dB
In reality, there are other noise sources besides quantiza-
tion noise: thermal noise, reference noise, clock jitter, etc.
For the MAX1126, SNR is computed by taking the ratio
of the RMS signal to the RMS noise. RMS noise
includes all spectral components to the Nyquist fre-
quency excluding the fundamental, the first six harmon-
ics (HD2–HD7), and the DC offset.
S ignal-to-Noise Plus Distortion (S INAD)
SINAD is computed by taking the ratio of the RMS sig-
nal to the RMS noise plus distortion. RMS noise plus
distortion includes all spectral components to the
Nyquist frequency, excluding the fundamental and the
DC offset.
Effec tive Number of Bits (ENOB)
ENOB specifies the dynamic performance of an ADC at
a specific input frequency and sampling rate. An ideal
ADC’s error consists of quantization noise only. ENOB for
a full-scale sinusoidal input waveform is computed from:
T otal Harmonic Distortion (T HD)
THD is the ratio of the RMS sum of the first six harmon-
ics of the input signal to the fundamental itself. This is
expressed as:
THD
V
V
V
V
V
V
V
=
×
+
+
+
+
+
20
22
32
42
52
62
72
1
log
ENOB
SINAD
=
1 76
.
6 02
.
CLK
ANALOG
INPUT
SAMPLED
DATA
T/H
t
AD
HOLD
TRACK
HOLD
t
AJ
Figure 10. Aperture J itter/Delay Specifications
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