參數(shù)資料
型號: MAC7121VAG40
廠商: FREESCALE SEMICONDUCTOR INC
元件分類: 微控制器/微處理器
英文描述: 32-BIT, FLASH, 40 MHz, RISC MICROCONTROLLER, PQFP112
封裝: 20 X 20 MM, 0.65 MM PITCH, ROHS COMPLIANT, LQFP-112
文件頁數(shù): 18/56頁
文件大?。?/td> 1216K
代理商: MAC7121VAG40
ElectricalCharacteristics
MAC7100 Microcontroller Family Hardware Specifications, Rev. 1.2
Preliminary
Freescale Semiconductor
25
3.10.1 Factors Influencing Accuracy
Three factors—source resistance, source capacitance and current injection—have an influence on the
accuracy of the ATD.
3.10.1.1 Source Resistance
Due to the input pin leakage current as specified in Table 8 in conjunction with the source resistance there
will be a voltage drop from the signal source to the ATD input. The maximum specified source resistance
RS, results in an error of less than 1/2 LSB (2.5 mV) at the maximum leakage current. If the device or
operating conditions are less than the worst case, or leakage-induced errors are acceptable, larger values
of source resistance are allowed.
3.10.1.2 Source Capacitance
When sampling, an additional internal capacitor is switched to the input. This can cause a voltage drop due
to charge sharing with the external capacitance and the pin capacitance. For a maximum sampling error of
the input voltage
≤ 1 LSB, then the external filter capacitor must be calculated as, C
f ≥ 1024 × (CINS – CINN).
3.10.1.3 Current Injection
There are two cases to consider:
1. A current is injected into the channel being converted. The channel being stressed has conversion
values of 0x3FF (0xFF in 8-bit mode) for analog inputs greater than VRH and 0x000 for values less
than VRL unless the current is higher than specified as disruptive condition.
2. Current is injected into pins in the neighborhood of the channel being converted. A portion of this
current is picked up by the channel (coupling ratio K), This additional current impacts the
accuracy of the conversion depending on the source resistance. The additional input voltage error
on the converted channel can be calculated as VERR = K × RS × IINJ, with IINJ being the sum of
the currents injected into the two pins adjacent to the converted channel.
Table 28. ATD Electrical Characteristics
Conditions are shown in Table 7 unless otherwise noted
Num C
Rating
Symbol
Min
Typ
Max
Unit
Q1
C Max input Source Resistance
RS
——
1
k
Ω
Q2
C Total Input Capacitance
Non Sampling
Sampling
CINN
CINS
10
22
pF
Q3
C Disruptive Analog Input Current
INA
–2.5
2.5
mA
Q4
C Coupling Ratio positive current injection
Kp
——
TBD
A / A
Q5
C Coupling Ratio negative current injection
Kn
——
TBD
A / A
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