參數(shù)資料
型號(hào): MAC7111VVF
廠商: Motorola, Inc.
英文描述: Handheld Infrared Thermometer; Temperature Measuring Range:-20 C to 500 C; Response Time:500ms; Features:Laser Sighting; Accuracy: 1%
中文描述: MAC7100微控制器系列硬件規(guī)格
文件頁數(shù): 3/48頁
文件大小: 1514K
代理商: MAC7111VVF
MOTOROLA
MAC7100 Microcontroller Family Hardware Specifications
PRELIMINARY—SUBJECT TO CHANGE WITHOUT NOTICE
For More Information On This Product,
Go to: www.freescale.com
3
Electrical Characteristics
3
Electrical Characteristics
This section contains electrical information for MAC7100 Family microcontrollers. The information is
preliminary and subject to change without notice.
MAC7100 Family devices are specified and tested over the 5 V and 3.3 V ranges. For operation at any
voltage within that range, the 3.3 V specifications generally apply. However, no production testing is done
to verify operation at intermediate supply voltage levels.
3.1
Parameter Classification
The electrical parameters shown in this appendix are derived by various methods. To provide a better
understanding to the designer, the following classification is used. Parameters are tagged accordingly in in
the column labeled “C” of the parametric tables, as appropriate.
3.2
Absolute Maximum Ratings
Absolute maximum ratings are stress ratings only. Functional operation outside these maximums is not
guaranteed. Stress beyond these limits may affect reliability or cause permanent damage to the device.
MAC7100 Family devices contain circuitry protecting against damage due to high static voltage or
electrical fields; however, it is advised that normal precautions be taken to avoid application of any voltages
higher than maximum-rated voltages to this high-impedance circuit. Reliability of operation is enhanced if
unused inputs are tied to an appropriate logic voltage level (for example, either V
SS
5 or V
DD
5).
Table 3. Absolute Maximum Ratings
Table 2. Parametric Value Classification
P
Parameters guaranteed during production testing on each individual device.
C
Parameters derived by the design characterization and by measuring a statistically relevant
sample size across process variations.
T
Parameters derived by design characterization on a small sample size from typical devices
under typical conditions (unless otherwise noted). All values shown in the typical column
are within this classification, even if not so tagged.
D
Parameters derived mainly from simulations.
Num
Rating
Symbol
Min
Max
Unit
A1
I/O, Regulator and Analog Supply Voltage
Digital Logic Supply Voltage
1
PLL Supply Voltage
1
V
DD
5
V
DD
2.5
V
DD
PLL
V
DD
A
V
RH,
V
RL
VDDX
VSSX
V
RH
– V
RL
V
DD
A – V
RH
V
IN
–0.3
+6.0
V
A2
–0.3
+3.0
V
A3
–0.3
+3.0
V
A4
ATD Supply Voltage
–0.3
+6.5
V
A5
Analog Reference
–0.3
+6.0
V
A6
Voltage difference V
DD
X to V
DD
A
Voltage difference V
SS
X to V
SS
A
Voltage difference V
RH
– V
RL
Voltage difference V
DD
A – V
RH
Digital I/O Input Voltage
–0.3
+0.3
V
A7
–0.3
+0.3
V
A8
–0.3
+6.5
V
A9
–6.5
+6.5
V
A10
–0.3
+6.0
V
F
Freescale Semiconductor, Inc.
n
.
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