參數(shù)資料
型號(hào)： M65617
廠商： Mitsubishi Electric Corporation
英文描述： PICTURE-IN-PICTURE SIGNAL PROCESSING
中文描述： 子母圖像信號(hào)處理
文件頁(yè)數(shù)： 10/15頁(yè)
文件大小： 74K
代理商： M65617
MITSUBISHI ICs (TV)
M65617SP
PICTURE-IN-PICTURE SIGNAL PROCESSING
10
SERIAL REGISTER INFORMATION
(cont.)
Sub-
address
setting
0
1
2
3
4
Bit No.
Reference
Register name
Function
1Bh
1
1
1
1
1
dft-bl
dft-misc
dft-sg
dft-syncbst
dft-clevel
Register 10h<7:0>, 11h<3.0>default gate; [1 setting]
Register 11h<7:4>default gate; [1 setting]
Register 13h<7:0>, 14h<6>, 17h<7:6>default gate; [1 setting]
Register 19h<7:0>default gate; [1 setting]
Register 12h<7:0>default gate; [1 setting]
Signal selection at 29 pin output mode; fsc/4fsc [0/1] [0 setting]
Operated when adjusting oscillation frequency
29 pin output mode authorization input/output [0/1] [Normally 0 setting]
Operated when adjusting oscillation frequency
Register 16h<7:0>default gate; [1 setting]
5
0
pin29osel
6
0
pin29oe
7
0
1
2
3
4
5
6
7
0
1
2
3
4
5
6
7
0
1
2
3
4
5
6
7
0
1
2
3
4
5
6
7
1
dft-clr
imag (0)
imag (1)
imag (2)
imag (3)
iphase (0)
iphase (1)
iphase (2)
iphase (3)
iphase (4)
iphase (5)
iphase (6)
iphase (7)
iphase (8)
for test
for test
rdof
clamp-offset (0)
clamp-offset (1)
clamp-offset (2)
clamp-offset (3)
clamp-offset (4)
clamp-offset (5)
for test
wdof
c-dac-ctrl (0)
c-dac-ctrl (1)
c-dac-ctrl (2)
c-dac-ctrl (3)
c-dac-ctrl (4)
c-dac-ctrl (5)
c-dac-ctrl (6)
bw
1Ch
read
For testing
For testing
1Dh
read
For testing
0 or 1
0 or 1
0 or 1
0 or 1
0 or 1
0 or 1
0 or 1
0 or 1
0 or 1
0 or 1
0 or 1
0 or 1
0 or 1
0 or 1
0 or 1
Simplified verification of main input loss; input unavailable/available [1/0]
1Eh
read
Clamping level information; for verification of internal operation information
Values are shown that are in proportion and corresponding to the depth of sub-
input information sync.
For testing
Simplified verification of sub-input loss; input unavailable/available [1/0]
1Fh
read
Level tracking information; for verification of internal operation information
Values are shown that are in proportion and corresponding to main input burst
amplitude
Unlock information; for verification of internal operation information
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