參數(shù)資料
型號: LVX259
廠商: ON SEMICONDUCTOR
英文描述: 8-Bit Addressable Latch/1-of-8 Decoder CMOS Logic Level Shifter with LSTTL−Compatible Inputs
文件頁數(shù): 7/10頁
文件大?。?/td> 114K
代理商: LVX259
MC74LVX259
http://onsemi.com
7
ORDERING INFORMATION
Device
Package
Shipping
MC74LVX259D
SOIC16
48 Units / Rail
MC74LVX259DG
SOIC16
(PbFree)
48 Units / Rail
MC74LVX259DR2
SOIC16
2500 Tape & Reel
MC74LVX259DR2G
SOIC16
(PbFree)
2500 Tape & Reel
MC74LVX259DT
TSSOP16*
96 Units / Rail
MC74LVX259DTR2
TSSOP16*
2500 Tape & Reel
MC74LVX259M
SOEIAJ16
50 Units / Rail
MC74LVX259MG
SOEIAJ16
(PbFree)
50 Units / Rail
MC74LVX259MEL
SOEIAJ16
2000 Tape & Reel
MC74LVX259MELG
SOEIAJ16
(PbFree)
2000 Tape & Reel
For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*This package is inherently PbFree.
EMBOSSED CARRIER DIMENSIONS
(See Notes 6 and 7)
Tape
Size
B
1
Max
D
D
1
E
F
K
P
P
0
P
2
R
T
W
8 mm
4.35 mm
(0.179”)
1.5 mm
+ 0.1
0.0
(0.059”
0004
+0.004
0.0)
1.0 mm
Min
(0.179”)
1.75 mm
±
0.1
(0.069
±
0.004”)
3.5 mm
±
0.5
(1.38
±
0.002”)
2.4 mm
Max
(0.094”)
4.0 mm
±
0.10
(0.157
±
0.004”)
4.0 mm
±
0.1
(0.157
±
0.004”)
2.0 mm
±
0.1
(0.079
±
0.004”)
25 mm
(0.98”)
0.6 mm
(0.024)
8.3 mm
(0.327)
12 mm
8.2 mm
(0.323”)
1.5 mm
Min
(0.060)
5.5 mm
±
0.5
(0.217
±
0.002”)
6.4 mm
Max
(0.252”)
4.0 mm
±
0.10
(0.157
±
0.004”)
8.0 mm
±
0.10
(0.315
±
0.004”)
30 mm
(1.18”)
12.0 mm
±
0.3
(0.470
±
0.012”)
16 mm
12.1 mm
(0.476”)
7.5 mm
±
0.10
(0.295
±
0.004”)
7.9 mm
Max
(0.311”)
4.0 mm
±
0.10
(0.157
±
0.004”)
8.0 mm
±
0.10
(0.315
±
0.004”)
12.0 mm
±
0.10
(0.472
±
0.004”)
16.3 mm
(0.642)
24 mm
20.1 mm
(0.791”)
11.5 mm
±
0.10
(0.453
±
0.004”)
11.9 mm
Max
(0.468”)
16.0 mm
±
0.10
(0.63
±
0.004”)
24.3 mm
(0.957)
6. Metric Dimensions GovernEnglish are in parentheses for reference only.
7. A
, B
, and K
are determined by component size. The clearance between the components and the cavity must be within 0.05 mm min to
0.50 mm max. The component cannot rotate more than 10
°
within the determined cavity
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