參數(shù)資料
型號: LH28F016SCT-L95
廠商: Sharp Corporation
英文描述: 16M Flash Memory 2M (】8)
中文描述: 1,600閃存200萬(】8)
文件頁數(shù): 17/37頁
文件大?。?/td> 326K
代理商: LH28F016SCT-L95
16M (1M × 16, 2M × 8) Flash Memory
LH28F016SU
17
Figure 7. Transient Input/Output
Reference Waveform (V
CC
= 5.0 V)
Figure 9. Transient Equivalent Testing
Load Circuit (V
CC
= 3.3 V)
Figure 8. Equivalent Testing
Load Circuit (V
CC
= 3.3 V)
Figure 10. Transient Equivalent Testing
Load Circuit (V
CC
= 5.0 V)
INPUT
TEST POINTS
OUTPUT
3.0
0.0
1.5
1.5
28F016SUT-7
NOTE:
AC test inputs are driven at 3.0 V for a Logic '1' and 0.0 V for a
Logic '0'. Input timing begins and output timing ends at 1.5 V.
Input rise and fall times (10% to 90%) < 10 ns.
2.5 ns OF 50
TRANSMISSION LINE
TOTAL CAPACITANCE = 50 pF
FROM OUTPUT
UNDER TEST
TEST
POINT
28F016SUT-8
2.5 ns OF 25
TRANSMISSION LINE
TOTAL CAPACITANCE = 100 pF
FROM OUTPUT
UNDER TEST
TEST
POINT
28F016SUT-9
INPUT
TEST POINTS
OUTPUT
2.4
0.45
2.0
0.8
2.0
0.8
28F016SUT-6
NOTE:
AC test inputs are driven at V
OH
(2.4 V
TTL
) for a Logic '1' and V
OL
(0.45 V
TTL
) for a Logic '0'. Input timing begins at V
IH
(2.0 V
TTL
)
and V
IL
(0.8 V
TTL
). Output timing ends at V
IH
and V
IL
. Input rise
and fall times (10% to 90%) < 10 ns.
2.5 ns OF 83
TRANSMISSION LINE
TOTAL CAPACITANCE = 30 pF
FROM OUTPUT
UNDER TEST
TEST
POINT
28F016SUT-18
Figure 11. High Speed Transient Equivalent
Testing Load Circuit (V
CC
= 5.0 V ± 5%)
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