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參數(shù)資料
| 型號(hào)： | LC99160GL-TP |
| 元件分類(lèi)： | 模擬信號(hào)調(diào)理 |
| 英文描述： | SPECIALTY ANALOG CIRCUIT, CQCC18 |
| 文件頁(yè)數(shù)： | 7/9頁(yè) |
| 文件大小： | 154K |
| 代理商： | LC99160GL-TP |
No. 6246-7/9
LC99160GL-TP
Output Buffer Circuit (Recommended circuit)
VOUT
LC99160GL
VDD
VRD
PR
PI1
PI2
PI3
NC
VPW
VGG
VOG
PH2
PH1
PS3
PS2
PS1
NC
NSUB
750
1.5 k
12 V
FET
2SK2394
A12680
Output Buffer Circuit
(Sanyo)
Note: To assure stable IC operation, 0.1 F bypass capacitors must be inserted between each DC voltage input pin (VRD, VDD, VGG, and VOG) and ground.
Test Procedures
The following test procedures must be performed under standard drive conditions (see pages 4 and 5), using the Sanyo
evaluation board, and using the Advantest T8331 tester.
1. Sensitivity
Use the CCD-SY1 (manufactured by Wakasa Optical Institute Ltd.) as the light source, and illuminate the surface of
the device with an intensity of 3.2 lux. Use the Advantest T8331 to measure the CCD output for each pixel center of
the screen as shown in the figure below. Use the average output values of each color pixel as Ye, Mg, and Cy. Take the
average value of the Ye, Mg, and Cy output values as the luminance sensitivity, S.
H/4
V/4
A12564
H/4
V/4
2. Image signal non uniformity
Perform this test under the following conditions.
Standard drive conditions (See the device specifications.)
Use a halogen lamp with a color temperature of 3200 K as the light source.
Use a C-500 (1 mm thick) IR blocking filter.
Set the CCD surface illumination to 3.2 lux and divide the screen into 45 blocks as shown below. Measure the average
value for each block and determine the maximum, minimum, and mean values. Determine the ratio of the difference
(between the maximum and the minimum values) to the mean value.
VF =
Maximum of the block averages – Minimum of the block averages
Mean of the block averages
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